Patents by Inventor John Miethke

John Miethke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for detecting voltage contrast in a semiconductor wafer
    Patent number: 6448099
    Abstract: A method is used to test a semiconductor wafer for misaligned layers formed therein. The method comprises forming a plurality of electrically conductive connections on a surface of the semiconductor wafer. A portion of the electrically conductive connections are coupled to a voltage supply. Thereafter, a voltage contrast analysis of the surface of the semiconductor wafer is performed, and a first pattern of the plurality of electrically conductive connections coupled to the voltage supply is determined from the voltage contrast analysis. The method further comprises comparing the first pattern to a desired pattern, and indicating an error in response to the first pattern differing from the desired pattern.
    Type: Grant
    Filed: November 28, 2000
    Date of Patent: September 10, 2002
    Assignee: Advanced Micro Devices, Inc.
    Inventors: John A. Iacoponi, Tom Spikes, Jr., John Miethke