Patents by Inventor John Moffitt

John Moffitt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11957915
    Abstract: A method of treating a patient and an external programmer for use with a neurostimulator. Electrical stimulation energy is conveyed into tissue of the patient via a specified combination of a plurality of electrodes, thereby creating one or more clinical effects. An influence of the specified electrode combination on the clinical effect(s) is determined. An anatomical region of interest is displayed in registration with a graphical representation of the plurality of electrodes. The displayed anatomical region of interest is modified based on the determined influence of the specified electrode combination on the clinical effect(s).
    Type: Grant
    Filed: March 29, 2022
    Date of Patent: April 16, 2024
    Assignee: Boston Scientific Neuromodulation Corporation
    Inventors: Michael A. Moffitt, John J. Reinhold
  • Patent number: 11936415
    Abstract: An air interface plane (AIP) of a radio frequency (RF) aperture includes: a circuit board having a first side and a second side opposite the first side; and a matrix of tapered elements arranged on the first side of the circuit board and secured to the circuit board, the matrix of tapered elements cooperating to at least one of receive or transmit an over-the-air RF signal. Suitably, each tapered element of the matrix has: a central hub extending along a longitudinal axis from a hub base which is proximate to the first side of the circuit board to an apex of the tapered element which is distal from the first side of the first circuit board; and a plurality of arms extending from the central hub at the apex of the tapered element, each of the plurality of arms including a first portion that projects the arm radially away from the longitudinal axis and a second portion that projects the arm longitudinally toward the first side of the circuit board.
    Type: Grant
    Filed: April 26, 2023
    Date of Patent: March 19, 2024
    Assignee: BATTELLE MEMORIAL INSTITUTE
    Inventors: Raphael Joseph Welsh, Douglas A. Thornton, Mackenzie Jordan Hawkins, Micah John Meleski, Katherine M. Armitage, Daniel G. Loesch, Matthew E. Huntwork, David R. Chase, Erik W. Edwards, John Bartholomew, Thomas Lloyd Moffitt, Curt Hudberg
  • Publication number: 20230316465
    Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.
    Type: Application
    Filed: May 26, 2023
    Publication date: October 5, 2023
    Applicant: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Patent number: 11663703
    Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.
    Type: Grant
    Filed: May 23, 2022
    Date of Patent: May 30, 2023
    Assignee: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Patent number: 11656184
    Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the specimen; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.
    Type: Grant
    Filed: August 5, 2022
    Date of Patent: May 23, 2023
    Assignee: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Publication number: 20220383480
    Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the specimen; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.
    Type: Application
    Filed: August 5, 2022
    Publication date: December 1, 2022
    Applicant: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Publication number: 20220284549
    Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.
    Type: Application
    Filed: May 23, 2022
    Publication date: September 8, 2022
    Applicant: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Patent number: 11408829
    Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the specimen; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.
    Type: Grant
    Filed: February 8, 2021
    Date of Patent: August 9, 2022
    Assignee: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Patent number: 11341617
    Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.
    Type: Grant
    Filed: February 8, 2021
    Date of Patent: May 24, 2022
    Assignee: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Publication number: 20210181121
    Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the specimen; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.
    Type: Application
    Filed: February 8, 2021
    Publication date: June 17, 2021
    Applicant: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andersen, Scott Pozzi-Loyola, Julie Orlando
  • Publication number: 20210166355
    Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.
    Type: Application
    Filed: February 8, 2021
    Publication date: June 3, 2021
    Applicant: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Publication number: 20210042884
    Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.
    Type: Application
    Filed: December 6, 2019
    Publication date: February 11, 2021
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Patent number: 10915992
    Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: February 9, 2021
    Assignee: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Patent number: 10914686
    Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the speciment; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.
    Type: Grant
    Filed: January 9, 2020
    Date of Patent: February 9, 2021
    Assignee: NANOTRONICS IMAGING, INC.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Publication number: 20200240925
    Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the speciment; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.
    Type: Application
    Filed: January 9, 2020
    Publication date: July 30, 2020
    Inventors: MATTHEW C. PUTMAN, JOHN B. PUTMAN, JOHN MOFFITT, MICHAEL MOSKIE, JEFFREY ANDRESEN, SCOTT POZZI-LOYOLA, JULIE ORLANDO
  • Patent number: 10676661
    Abstract: Fluid compositions including a base fluid and at least one granular hemicellulose material. The base fluid may be an oleaginous fluid or a non-oleaginous fluid. The granular hemicellulose material may have a cumulative particle size distribution D90 of about 4 mm or less and D10 of about 1 mm or greater, or D90 of 2.5 mm or less and D10 of about 1.5 mm or greater, or even D90 of about 3.8 mm or less, and D10 of about 2.4 mm or greater. The granular hemicellulose materials useful may have an average aspect ratio equal to or less than about 5:1, an average aspect ratio equal to or less than about 2:1, or even an average aspect ratio is about 1:1. The granular hemicellulose materials have hemicellulose in an amount from about 10% to about 50% by weight, cellulose in an amount from about 30% to about 50% by weight, and lignin in an amount from about 5% to about 35% by weight.
    Type: Grant
    Filed: November 18, 2015
    Date of Patent: June 9, 2020
    Assignee: M-I L.L.C.
    Inventors: James Friedheim, John Moffitt, Joshua Sheldon, Quanxin Guo
  • Patent number: 10545096
    Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, a lens having a view encompassing the specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module configured to control a position of the stage, an elevation of the moveable platform, and a focus of the lens. In some implementations, the inspection apparatus includes an image processing system configured for receiving image data from the imaging device, analyzing the image data to determine a specimen classification, and automatically selecting an illumination profile based on the specimen classification. Methods and machine-readable media are also contemplated.
    Type: Grant
    Filed: January 30, 2019
    Date of Patent: January 28, 2020
    Assignee: NANOTRONICS IMAGING, INC.
    Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
  • Patent number: 9784102
    Abstract: A fracture insert is disclosed including a first cylindrical portion and a second cylindrical portion disposed opposite the first cylindrical portion defining a radial gap therebetween to form an axial flow channel. The axial flow channel provides a flow path for a drilling fluid from a top of the cylindrical portions to a bottom of the cylindrical portions and the radial gap provides a flow path for the drilling fluid from the axial flow channel to a radial terminus of the first cylindrical portion and the second cylindrical portion.
    Type: Grant
    Filed: May 10, 2013
    Date of Patent: October 10, 2017
    Assignee: M-I L.L.C.
    Inventors: Aaron Blue, John Moffitt
  • Patent number: 9410304
    Abstract: In one aspect, a lift assembly for a work vehicle may include a loader arm and a control arm extending between first and second ends. The first end may be coupled to a chassis of the vehicle at a first pivot point and the second end may be coupled to a rear end of the loader arm at a second pivot point. Additionally, the lift assembly may include a lift cylinder coupled between the loader arm and the chassis and a control cylinder extending between upper and lower ends, with the upper end being coupled the control arm and the lower end being coupled to the chassis at a third pivot point.
    Type: Grant
    Filed: April 28, 2014
    Date of Patent: August 9, 2016
    Assignee: CNH Industrial America LLC
    Inventors: Lance Taylor, John Moffitt
  • Publication number: 20160137903
    Abstract: Fluid compositions including a base fluid and at least one granular hemicellulose material. The base fluid may be an oleaginous fluid or a non-oleaginous fluid. The granular hemicellulose material may have a cumulative particle size distribution D90 of about 4 mm or less and D10 of about 1 mm or greater, or D90 of 2.5 mm or less and D10 of about 1.5 mm or greater, or even D90 of about 3.8 mm or less, and D10 of about 2.4 mm or greater. The granular hemicellulose materials useful may have an average aspect ratio equal to or less than about 5:1, an average aspect ratio equal to or less than about 2:1, or even an average aspect ratio is about 1:1. The granular hemicellulose materials have hemicellulose in an amount from about 10% to about 50% by weight, cellulose in an amount from about 30% to about 50% by weight, and lignin in an amount from about 5% to about 35% by weight.
    Type: Application
    Filed: November 18, 2015
    Publication date: May 19, 2016
    Inventors: James Friedheim, John Moffitt, Joshua Sheldon, Quanxin Guo