Patents by Inventor John Moffitt
John Moffitt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11957915Abstract: A method of treating a patient and an external programmer for use with a neurostimulator. Electrical stimulation energy is conveyed into tissue of the patient via a specified combination of a plurality of electrodes, thereby creating one or more clinical effects. An influence of the specified electrode combination on the clinical effect(s) is determined. An anatomical region of interest is displayed in registration with a graphical representation of the plurality of electrodes. The displayed anatomical region of interest is modified based on the determined influence of the specified electrode combination on the clinical effect(s).Type: GrantFiled: March 29, 2022Date of Patent: April 16, 2024Assignee: Boston Scientific Neuromodulation CorporationInventors: Michael A. Moffitt, John J. Reinhold
-
Patent number: 11936415Abstract: An air interface plane (AIP) of a radio frequency (RF) aperture includes: a circuit board having a first side and a second side opposite the first side; and a matrix of tapered elements arranged on the first side of the circuit board and secured to the circuit board, the matrix of tapered elements cooperating to at least one of receive or transmit an over-the-air RF signal. Suitably, each tapered element of the matrix has: a central hub extending along a longitudinal axis from a hub base which is proximate to the first side of the circuit board to an apex of the tapered element which is distal from the first side of the first circuit board; and a plurality of arms extending from the central hub at the apex of the tapered element, each of the plurality of arms including a first portion that projects the arm radially away from the longitudinal axis and a second portion that projects the arm longitudinally toward the first side of the circuit board.Type: GrantFiled: April 26, 2023Date of Patent: March 19, 2024Assignee: BATTELLE MEMORIAL INSTITUTEInventors: Raphael Joseph Welsh, Douglas A. Thornton, Mackenzie Jordan Hawkins, Micah John Meleski, Katherine M. Armitage, Daniel G. Loesch, Matthew E. Huntwork, David R. Chase, Erik W. Edwards, John Bartholomew, Thomas Lloyd Moffitt, Curt Hudberg
-
Publication number: 20230316465Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.Type: ApplicationFiled: May 26, 2023Publication date: October 5, 2023Applicant: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Patent number: 11663703Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.Type: GrantFiled: May 23, 2022Date of Patent: May 30, 2023Assignee: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Patent number: 11656184Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the specimen; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.Type: GrantFiled: August 5, 2022Date of Patent: May 23, 2023Assignee: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Publication number: 20220383480Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the specimen; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.Type: ApplicationFiled: August 5, 2022Publication date: December 1, 2022Applicant: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Publication number: 20220284549Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.Type: ApplicationFiled: May 23, 2022Publication date: September 8, 2022Applicant: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Patent number: 11408829Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the specimen; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.Type: GrantFiled: February 8, 2021Date of Patent: August 9, 2022Assignee: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Patent number: 11341617Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.Type: GrantFiled: February 8, 2021Date of Patent: May 24, 2022Assignee: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Publication number: 20210181121Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the specimen; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.Type: ApplicationFiled: February 8, 2021Publication date: June 17, 2021Applicant: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andersen, Scott Pozzi-Loyola, Julie Orlando
-
Publication number: 20210166355Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.Type: ApplicationFiled: February 8, 2021Publication date: June 3, 2021Applicant: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Publication number: 20210042884Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.Type: ApplicationFiled: December 6, 2019Publication date: February 11, 2021Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Patent number: 10915992Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.Type: GrantFiled: December 6, 2019Date of Patent: February 9, 2021Assignee: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Patent number: 10914686Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the speciment; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.Type: GrantFiled: January 9, 2020Date of Patent: February 9, 2021Assignee: NANOTRONICS IMAGING, INC.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Publication number: 20200240925Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module coupled to the imaging device, each of the lights and the moveable platform. The control module is configured to perform operations including: receiving image data from the imaging device, where the image data indicates an illumination landscape of light incident on the speciment; and automatically modifying, based on the image data, an elevation of the moveable platform or an intensity of one or more of the lights to adjust the illumination landscape. Methods and machine-readable media are also contemplated.Type: ApplicationFiled: January 9, 2020Publication date: July 30, 2020Inventors: MATTHEW C. PUTMAN, JOHN B. PUTMAN, JOHN MOFFITT, MICHAEL MOSKIE, JEFFREY ANDRESEN, SCOTT POZZI-LOYOLA, JULIE ORLANDO
-
Patent number: 10676661Abstract: Fluid compositions including a base fluid and at least one granular hemicellulose material. The base fluid may be an oleaginous fluid or a non-oleaginous fluid. The granular hemicellulose material may have a cumulative particle size distribution D90 of about 4 mm or less and D10 of about 1 mm or greater, or D90 of 2.5 mm or less and D10 of about 1.5 mm or greater, or even D90 of about 3.8 mm or less, and D10 of about 2.4 mm or greater. The granular hemicellulose materials useful may have an average aspect ratio equal to or less than about 5:1, an average aspect ratio equal to or less than about 2:1, or even an average aspect ratio is about 1:1. The granular hemicellulose materials have hemicellulose in an amount from about 10% to about 50% by weight, cellulose in an amount from about 30% to about 50% by weight, and lignin in an amount from about 5% to about 35% by weight.Type: GrantFiled: November 18, 2015Date of Patent: June 9, 2020Assignee: M-I L.L.C.Inventors: James Friedheim, John Moffitt, Joshua Sheldon, Quanxin Guo
-
Patent number: 10545096Abstract: The disclosed technology relates to an inspection apparatus that includes a stage configured to retain a specimen for inspection, an imaging device having a field of view encompassing at least a portion of the stage to view a specimen retained on the stage, a lens having a view encompassing the specimen retained on the stage, and a plurality of lights disposed on a moveable platform. The inspection apparatus can further include a control module configured to control a position of the stage, an elevation of the moveable platform, and a focus of the lens. In some implementations, the inspection apparatus includes an image processing system configured for receiving image data from the imaging device, analyzing the image data to determine a specimen classification, and automatically selecting an illumination profile based on the specimen classification. Methods and machine-readable media are also contemplated.Type: GrantFiled: January 30, 2019Date of Patent: January 28, 2020Assignee: NANOTRONICS IMAGING, INC.Inventors: Matthew C. Putman, John B. Putman, John Moffitt, Michael Moskie, Jeffrey Andresen, Scott Pozzi-Loyola, Julie Orlando
-
Patent number: 9784102Abstract: A fracture insert is disclosed including a first cylindrical portion and a second cylindrical portion disposed opposite the first cylindrical portion defining a radial gap therebetween to form an axial flow channel. The axial flow channel provides a flow path for a drilling fluid from a top of the cylindrical portions to a bottom of the cylindrical portions and the radial gap provides a flow path for the drilling fluid from the axial flow channel to a radial terminus of the first cylindrical portion and the second cylindrical portion.Type: GrantFiled: May 10, 2013Date of Patent: October 10, 2017Assignee: M-I L.L.C.Inventors: Aaron Blue, John Moffitt
-
Patent number: 9410304Abstract: In one aspect, a lift assembly for a work vehicle may include a loader arm and a control arm extending between first and second ends. The first end may be coupled to a chassis of the vehicle at a first pivot point and the second end may be coupled to a rear end of the loader arm at a second pivot point. Additionally, the lift assembly may include a lift cylinder coupled between the loader arm and the chassis and a control cylinder extending between upper and lower ends, with the upper end being coupled the control arm and the lower end being coupled to the chassis at a third pivot point.Type: GrantFiled: April 28, 2014Date of Patent: August 9, 2016Assignee: CNH Industrial America LLCInventors: Lance Taylor, John Moffitt
-
Publication number: 20160137903Abstract: Fluid compositions including a base fluid and at least one granular hemicellulose material. The base fluid may be an oleaginous fluid or a non-oleaginous fluid. The granular hemicellulose material may have a cumulative particle size distribution D90 of about 4 mm or less and D10 of about 1 mm or greater, or D90 of 2.5 mm or less and D10 of about 1.5 mm or greater, or even D90 of about 3.8 mm or less, and D10 of about 2.4 mm or greater. The granular hemicellulose materials useful may have an average aspect ratio equal to or less than about 5:1, an average aspect ratio equal to or less than about 2:1, or even an average aspect ratio is about 1:1. The granular hemicellulose materials have hemicellulose in an amount from about 10% to about 50% by weight, cellulose in an amount from about 30% to about 50% by weight, and lignin in an amount from about 5% to about 35% by weight.Type: ApplicationFiled: November 18, 2015Publication date: May 19, 2016Inventors: James Friedheim, John Moffitt, Joshua Sheldon, Quanxin Guo