Patents by Inventor John O. Torode

John O. Torode has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card with an adapter layer for testing integrated circuits
    Patent number: 6847218
    Abstract: In one embodiment, an environment for testing integrated circuits includes a first die coupled to a tester. The first die includes a removable connection configured to couple a signal from the first die with an adapter layer to a second die being tested. The removable connection may be an elastomeric interposer or a probe, for example.
    Type: Grant
    Filed: May 13, 2002
    Date of Patent: January 25, 2005
    Assignee: Cypress Semiconductor Corporation
    Inventors: James E. Nulty, Brenor L. Brophy, Thomas A. McCleary, Bo Jin, Qi Gu, Thurman J. Rodgers, John O. Torode