Patents by Inventor John Onofrey

John Onofrey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for generating attenuation map from SPECT emission data
    Patent number: 12073492
    Abstract: A system for estimating attenuation coefficients from only single photon emission computed tomography (SPECT) emission data using deep neural networks includes an artificial neural network based upon machine learning system estimating attenuation maps for SPECT emission data, and associated attenuation correction method.
    Type: Grant
    Filed: April 17, 2020
    Date of Patent: August 27, 2024
    Assignee: YALE UNIVERSITY
    Inventors: Luyao Shi, Chi Liu, John Onofrey, Hui Liu
  • METHOD AND SYSTEM FOR GENERATING ATTENUATION MAP FROM SPECT EMISSION DATA
    Publication number: 20220207791
    Abstract: A system for estimating attenuation coefficients from only single photon emission computed tomography (SPECT) emission data using deep neural networks includes an artificial neural network based upon machine learning system estimating attenuation maps for SPECT emission data, and associated attenuation correction method.
    Type: Application
    Filed: April 17, 2020
    Publication date: June 30, 2022
    Inventors: Luyao Shi, Chi Liu, John Onofrey, Hui Liu