Patents by Inventor John P. Crupi

John P. Crupi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for coordinating state and execution context of interpreted languages
    Patent number: 7770152
    Abstract: A system that includes a shared variable scope configured to store at least one shared variable binding, a first interpreter configured to search the shared variable scope to determine a variable binding for a variable, and a second interpreter configured to search the shared variable scope to determine the variable binding for the variable.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: August 3, 2010
    Assignee: Oracle America, Inc.
    Inventors: Yury Kamen, Deepak Alur, Syed M. Ali, John P. Crupi, Daniel B. Malks
  • Method and apparatus for tracking changes in a system
    Patent number: 7703074
    Abstract: A method for analyzing a target system that includes obtaining a plurality of characteristics from the target system using a characteristics extractor, wherein the plurality of characteristics is associated with a characteristics model, storing each of the plurality of characteristics in a characteristics store using a tracking mechanism, and analyzing the target system by issuing a query to the characteristics store to obtain an analysis result, wherein the query uses tracking information associated with the tracking mechanism.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: April 20, 2010
    Assignee: Oracle America, Inc.
    Inventors: Yury Kamen, Syed M. Ali, Deepak Alur, John P. Crupi, Daniel B. Malks
  • Method and apparatus for generating components for pattern-based system design analysis using a characteristics model
    Patent number: 7660802
    Abstract: A method for analyzing a target system that includes obtaining a characteristics model, generating at least one selected from the group consisting of a schema, characteristics store API, and a characteristics extractor, using the characteristics model, obtaining a plurality of characteristics from the target system using characteristics extractor, wherein each of the plurality of characteristics is associated with the characteristics model, storing each of the plurality of characteristics in the characteristics store using the schema, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: February 9, 2010
    Assignee: Sun Microsystems, Inc.
    Inventors: Syed M. Ali, Yury Kamen, Deepak Alur, John P. Crupi, Daniel B. Malks
  • Method and apparatus for generating a characteristics model for a pattern-based system design analysis using a schema
    Patent number: 7653898
    Abstract: A method for analyzing a target system that includes generating a characteristics model using a schema defining a domain, obtaining a plurality of characteristics from the target system using a characteristics extractor, wherein the plurality of characteristics is associated with the characteristics model storing each of the plurality of characteristics in a characteristics store, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: January 26, 2010
    Assignee: Sun Microsystems, Inc.
    Inventors: Syed M. Ali, Yury Kamen, Deepak Alur, John P. Crupi, Daniel B. Malks, Rajmohan Krishnamurthy
  • Method and apparatus for pattern-based system design analysis using a meta model
    Patent number: 7634766
    Abstract: A method for analyzing a target system that includes obtaining a characteristics model, loading the characteristics model into a meta model, obtaining a plurality of characteristics from the target system using a characteristics extractor, wherein each of the plurality of characteristics is associated with the characteristics model, storing each of the plurality of characteristics obtained from the target system in a characteristics store, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result, wherein the issuing the at least one query comprises verifying the at least one query using the meta model.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: December 15, 2009
    Assignee: Sun Microsystems, Inc.
    Inventors: Syed M. Ali, Yury Kamen, Deepak Alur, John P. Crupi, Daniel B. Malks, Michael W. Godfrey
  • Method and apparatus for transparent invocation of a characteristics extractor for pattern-based system design analysis
    Patent number: 7571434
    Abstract: A method for analyzing a target system that includes obtaining a plurality of characteristics from the target system using a characteristics extractor and at least one selected from the group consisting of a software build project associated with the target system and a modified software build project associated with the target system, wherein the plurality of characteristics is associated with a characteristics model, storing each of the plurality of characteristics in a characteristics store, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: August 4, 2009
    Assignee: Sun Microsystems, Inc.
    Inventors: Yury Kamen, Deepak Alur, John P. Crupi, Daniel B. Malks, Syed M. Ali