Abstract: The quality of x-ray images is significantly enhanced by adjusting the x-ray system operating parameters in real time during acquisition of x-ray data to take information about the part into account adaptively. X-ray energy, x-ray flux, and integration time can all by varied independently and in combination to improve the signal to noise ratio in the image. The x-ray data from a previous subsection of the image is processed to determine optimum system operating parameters for a next image subsection. x-ray tube voltage is adjusted to change x-ray energy and keep .alpha.L close to 2 over all image subsections. X-ray tube current is adjusted to change x-ray flux and data acquisition integration time is adjusted to keep the signal to noise ratio within limits.

Abstract: An X-ray inspection system includes an X-ray source for generating a directed X-ray beam and a linear array detector for measuring the intensity of the received radiation and generating electrical signals representative thereof. A method for aligning the detector with the directed X-ray beam includes removing any part between the X-ray source and the detector, opening an X-ray beam limiter, positioning the linear array detector for maximum signal from each detector element, reducing the X-ray beam limiter opening, detecting whether any signal from a detector element is reduced, moving the limiter for producing a maximum signal on each signal, securing the X-ray beam limiter, and positioning the detector array for maximum signal.

Abstract: An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparatus for automatically positioning the parts in an X-ray machine for obtaining fluoroscopy and tomography views of the part and for acquiring data from the inspections at production rates. The system automatically identifies the location of rejectable flaws in the parts during the fluoroscopy scanning and subsequently identifies those locations for obtaining tomography scans, if the identified flaw location is questionable. The system can automatically reject parts containing flaws identified during the fluoroscopy inspections. This system operates in a real-time environment by providing analysis of one part while a subsequent part is being subjected to X-ray examination.