Abstract: A circuit includes three PMOS transistors (PMOS) and three NMOS transistors (NMOS). The first PMOS has a source receiving a supply voltage and a gate receiving a first signal. The second PMOS has a source coupled to a drain of the first PMOS, a gate receiving a clock signal, and a drain generating a second signal. The third PMOS has a source receiving the supply voltage, and a drain coupled to the drain of the second PMOS. The first NMOS has a drain coupled to the drain of the second PMOS, and a gate coupled to a gate of the third PMOS. The second NMOS has a gate receiving the first signal, and a drain coupled to a source of the first NMOS. The third NMOS has a gate coupled to the gate of the third PMOS transistor, and a drain coupled to the drain of the third PMOS.

Abstract: A circuit includes three PMOS transistors (PMOS) and three NMOS transistors (NMOS). The first PMOS has a source receiving a supply voltage and a gate receiving a first signal. The second PMOS has a source coupled to a drain of the first PMOS, a gate receiving a clock signal, and a drain generating a second signal. The third PMOS has a source receiving the supply voltage, and a drain coupled to the drain of the second PMOS. The first NMOS has a drain coupled to the drain of the second PMOS, and a gate coupled to a gate of the third PMOS. The second NMOS has a gate receiving the first signal, and a drain coupled to a source of the first NMOS. The third NMOS has a gate coupled to the gate of the third PMOS transistor, and a drain coupled to the drain of the third PMOS.

Abstract: A method for designing a standard cell, e.g. a multi-bit flip-flop, can include identifying a first set of transistors. This first set functions to source power or ground to circuits of the standard cell. A second set of transistors can be determined and correlated. This second set forms at least part of the first set of transistors. Each correlated group in the second set of transistors receives identical signals, e.g. scan enable, reset, and/or set signals, and provides a same sourcing. A third set of transistors can then be created. This third set has fewer transistors than the second set. The second set of transistors can be deleted in the standard cell. The third set of transistors can be connected to the circuits of the standard cell. This method can significantly extend circuit consolidation to improve the area benefit of multi-bit standard cells.

Abstract: A method for designing a standard cell, e.g. a multi-bit flip-flop, can include identifying a first set of transistors. This first set functions to source power or ground to circuits of the standard cell. A second set of transistors can be determined and correlated. This second set forms at least part of the first set of transistors. Each correlated group in the second set of transistors receives identical signals, e.g. scan enable, reset, and/or set signals, and provides a same sourcing. A third set of transistors can then be created. This third set has fewer transistors than the second set. The second set of transistors can be deleted in the standard cell. The third set of transistors can be connected to the circuits of the standard cell. This method can significantly extend circuit consolidation to improve the area benefit of multi-bit standard cells.

Abstract: A step down voltage regulator with bypass comprised of devices designed to operate over a maximum rated voltage lower than a supply voltage. The regulator includes an output regulation device coupled to the supply voltage and an output. An output device protection circuit is provided which is responsive to the supply voltage and the output to ensure that the maximum rated voltage of the output regulation device is not exceeded. A bypass circuit having a bypass output device and being coupled to the supply voltage is provided with a protection circuit. The output regulation devices comprise p-channel transistors, and may have an operating maximum rated voltage in a range of 2.7-3.6 volts with the supply voltage is in a range of 4.4-5.25 volts, or 2.9-3.5 volts.

Abstract: A system and method for supplying power to a peripheral device where the voltage supplied by a host device may be the voltage required for operation of the peripheral, or a higher voltage. A memory system includes a voltage regulator including an input, and output and a bypass shorting the input to the output. A voltage detector communicates with the regulator. A Bypass enable signal operable responsive to a signal generated by the host device indicating that the power up of the host is complete is coupled to the bypass element. A method for operating a voltage regulator in a memory system includes the steps of: providing a voltage regulator having an input and an output, and including a bypass shorting the input to the output; setting the bypass to off prior to power up of a host device; responsive to a power up completion signal from a host device, determining the power supplied by the host; and if the power supplied by the host is below a threshold operating voltage, enabling the bypass.

Abstract: A step down voltage regulator including devices designed to operate over a maximum rated voltage lower than the supply voltage. The regulator comprises an output regulation device coupled to the supply voltage and an output; and an output device protection circuit responsive to the supply voltage and the output to ensure that the maximum rated voltage of the output device is not exceeded. Also provided is a method for operating a voltage regulator in a memory system. The method includes the steps of: providing a voltage regulator having an input and an output, and including a plurality of devices operating at a maximum rated voltage less than the voltage provided at the input; and controlling the gate voltage of the output device responsive to a load on the regulator output, so that the maximum rated voltage is not exceeded.

Abstract: A step down voltage regulator with bypass comprised of devices designed to operate over a maximum rated voltage lower than a supply voltage. The regulator includes an output regulation device coupled to the supply voltage and an output. An output device protection circuit is provided which is responsive to the supply voltage and the output to ensure that the maximum rated voltage of the output regulation device is not exceeded. A bypass circuit having a bypass output device and being coupled to the supply voltage is provided with a protection circuit. The output regulation devices comprise p-channel transistors, and may have an operating maximum rated voltage in a range of 2.7-3.6 volts with the supply voltage is in a range of 4.4-5.25 volts, or 2.9-3.5 volts.

Abstract: A step down voltage regulator including devices designed to operate over a maximum rated voltage lower than the supply voltage. The regulator comprises an output regulation device coupled to the supply voltage and an output; and an output device protection circuit responsive to the supply voltage and the output to ensure that the maximum rated voltage of the output device is not exceeded. Also provided is a method for operating a voltage regulator in a memory system. The method includes the steps of: providing a voltage regulator having an input and an output, and including a plurality of devices operating at a maximum rated voltage less than the voltage provided at the input; and controlling the gate voltage of the output device responsive to a load on the regulator output, so that the maximum rated voltage is not exceeded.

Abstract: A system and method for quickly and efficiently programming hard-to-program storage elements in non-volatile integrated memory devices is presented. A number of storage elements are simultaneously subjected to a programming process with the current flowing through the storage elements limited to a first level. As a portion of these storage elements reach a prescribed state, they are removed from the set of cells being programmed and the current limit on the elements that continue to be programmed is raised. The current level in these hard-to-program cells can be raised to a second, higher limit or unregulated.

Abstract: A system and method for supplying power to a peripheral device where the voltage supplied by a host device may be the voltage required for operation of the peripheral, or a higher voltage. A memory system includes a voltage regulator including an input, and output and a bypass shorting the input to the output. A voltage detector communicates with the regulator. A Bypass enable signal operable responsive to a signal generated by the host device indicating that the power up of the host is complete is coupled to the bypass element. A method for operating a voltage regulator in a memory system includes the steps of: providing a voltage regulator having an input and an output, and including a bypass shorting the input to the output; setting the bypass to off prior to power up of a host device; responsive to a power up completion signal from a host device, determining the power supplied by the host; and if the power supplied by the host is below a threshold operating voltage, enabling the bypass.

Abstract: A race-free arithmetic operation circuit is disclosed. The circuit comprises a register file array, an arithmetic logic unit (ALU), and apparatus for controlling the input and/or the output signal of the ALU. The apparatus for controlling can be two level-sensitive latches, located before and after the ALU, or one master-slave flip-flop, located either before or after the ALU.