Patents by Inventor John Patrick Hole

John Patrick Hole has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Calibration of instruments
    Patent number: 9909970
    Abstract: Disclosed is a method of calibrating apparatus for optically characterizing samples of particles of small size. Also disclosed is a method of estimating the concentration of particles in a population of small size particles.
    Type: Grant
    Filed: November 7, 2014
    Date of Patent: March 6, 2018
    Assignee: Malvern Instruments Limited
    Inventors: John Patrick Hole, Jonathan Benjamin Kendall Smith, Ian John Wilson, Andrew Paul Malloy
  • Calibration of Instruments
    Publication number: 20160290911
    Abstract: Disclosed is a method of calibrating apparatus for optically characterising samples of particles of small size. Also disclosed is a method of estimating the concentration of particles in a population of small size particles.
    Type: Application
    Filed: November 7, 2014
    Publication date: October 6, 2016
    Applicant: Malvern Instruments Limited
    Inventors: John Patrick HOLE, Jonathan Benjamin Kendall SMITH, Ian John WILSON, Andrew Paul MALLOY
  • Method and apparatus for analyzing a sample of sub-micron particles
    Patent number: 9341559
    Abstract: The present invention provides a method of analyzing a sample comprising sub-micron particles, comprising determining first information about the size of particles and number of particles in the sample by nanoparticle tracking analysis; determining second information about average particle size of particles in the sample by dynamic light scattering; determining from the first information third information representing the theoretical effect of the detected particles on results obtainable by dynamic light scattering; and adjusting the second information using the third information to produce fourth information representing adjusted information on average particle size.
    Type: Grant
    Filed: August 6, 2012
    Date of Patent: May 17, 2016
    Assignee: Malvern Instruments Limited
    Inventors: Robert Jeffrey Geddes Carr, John Patrick Hole, Jonathan Benjamin Kendall Smith
  • Optical Detection and Analysis of Particles
    Publication number: 20140152978
    Abstract: The present invention provides a method of analysing a sample comprising sub-micron particles, comprising determining first information about the size of particles and number of particles in the sample by nanoparticle tracking analysis; determining second information about average particle size of particles in the sample by dynamic light scattering; determining from the first information third information representing the theoretical effect of the detected particles on results obtainable by dynamic light scattering; and adjusting the second information using the third information to produce fourth information representing adjusted information on average particle size.
    Type: Application
    Filed: August 6, 2012
    Publication date: June 5, 2014
    Applicant: NanoSight Limited
    Inventors: Robert Jeffrey Geddes Carr, John Patrick Hole, Jonathan Benjamin Kendall Smith