Patents by Inventor John Patrick Toscano

John Patrick Toscano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Modular automated test system
    Patent number: 11953519
    Abstract: An example test system includes packs. The packs include test sockets for testing devices under test (DUTs) and at least some test electronics for performing tests on the DUTs in the test sockets. Different packs are configured to have different configurations. The different configurations include at least different numbers of test sockets arranged at different pitches.
    Type: Grant
    Filed: October 22, 2020
    Date of Patent: April 9, 2024
    Assignee: TERADYNE, INC.
    Inventors: Christopher James Bruno, Philip Luke Campbell, Adnan Khalid, Evgeny Polyakov, John Patrick Toscano
  • Test site configuration in an automated test system
    Patent number: 11754596
    Abstract: An example test system includes a test socket for testing a DUT, a lid for the test socket, and an actuator configured to force the lid onto the test socket and to remove the lid from the test socket. The actuator includes an upper arm to move the lid, an attachment mechanism connected to the upper arm to contact the lid, where the attachment mechanism is configured to allow the lid to float relative to the test socket to enable alignment between the lid and the test socket, and a lower arm to anchor the actuator to a board containing the test socket. The actuator is configured to move the upper arm linearly towards and away from the test socket and to rotate the upper arm towards and away from the test socket.
    Type: Grant
    Filed: October 22, 2020
    Date of Patent: September 12, 2023
    Assignee: TERADYNE, INC.
    Inventors: Michael O. McKenna, Christopher James Bruno, Philip Luke Campbell, John Patrick Toscano
  • TEST SITE CONFIGURATON IN AN AUTOMATED TEST SYSTEM
    Publication number: 20220128597
    Abstract: An example test system includes a test socket for testing a DUT, a lid for the test socket, and an actuator configured to force the lid onto the test socket and to remove the lid from the test socket. The actuator includes an upper arm to move the lid, an attachment mechanism connected to the upper arm to contact the lid, where the attachment mechanism is configured to allow the lid to float relative to the test socket to enable alignment between the lid and the test socket, and a lower arm to anchor the actuator to a board containing the test socket. The actuator is configured to move the upper arm linearly towards and away from the test socket and to rotate the upper arm towards and away from the test socket.
    Type: Application
    Filed: October 22, 2020
    Publication date: April 28, 2022
    Inventors: Michael O. McKenna, Christopher James Bruno, Philip Luke Campbell, John Patrick Toscano
  • MODULAR AUTOMATED TEST SYSTEM
    Publication number: 20220128598
    Abstract: An example test system includes packs. The packs include test sockets for testing devices under test (DUTs) and at least some test electronics for performing tests on the DUTs in the test sockets. Different packs are configured to have different configurations. The different configurations include at least different numbers of test sockets arranged at different pitches.
    Type: Application
    Filed: October 22, 2020
    Publication date: April 28, 2022
    Inventors: Christopher James Bruno, Philip Luke Campbell, Adnan Khalid, Evgeny Polyakov, John Patrick Toscano