Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that loading effects of the probe are substantially removed from the measurement. A signal under test from a device under test is coupled to the test probe and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. A trigger signal synchronized to the signal under test is coupled to the oscilloscope system to trigger the oscilloscope. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that loading effects of the probe are substantially removed from the measurement. A signal under test from a device under test is coupled to the test probe and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Zref) is retrieved that is associated with the transfer parameters and the characteristic impedance of an oscilloscope system coupled to the device under test. The transfer parameters of the device under test and the reference impedance (Zref) are processed to effect thereby a representation of the device under test impedance (Zeq) as a function of frequency.

Abstract: A multiband amplifier for a test and measurement instrument includes a splitter to split an input signal into split signals, amplifiers, and means for combining and digitizing the amplified signals into a digitized signal. Each amplifier is configured to amplify an associated split signal over an amplifier passband. The amplifier passband of at least one amplifier is different from the amplifier passband of another amplifier.

Abstract: An acquisition apparatus for a test and measurement instrument includes an input to receive an input signal, a digitizer to digitize a selected signal, a bypass path to selectively couple the input to the digitizer, a frequency shift path to frequency shift the input signal and selectively couple the frequency-shifted input signal to the digitizer, the frequency shift path including a means for frequency shifting, an input switch to switch the input signal to one of the bypass path and the frequency shift path, and an output switch to provide the selected signal to the digitizer by selectively coupling an output of one of the frequency shift path and the bypass path to the digitizer.

Abstract: An enhancement filter for an oscilloscope is disclosed wherein the enhacement filter may be initially calibrated for one or more channels and/or for one or more attenuation settings such as 50 mV per division, 100 mV per division, and/or 200 mV per division, for example.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (?L) is defined representative of an arbitrary impedance load coupled to the device under test and an equalization filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional acquired samples are acquired using the equalization filter to effect thereby a representation of the arbitrary impedance loading of the device under test.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Zref) is retrieved that is associated with the transfer parameters and the characteristic impedance of an oscilloscope system coupled to the device under test. The transfer parameters of the device under test and the reference impedance (Zref) are processed to effect thereby a representation of the device under test impedance (Zeq) as a function of frequency.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that digital samples acquired by the system are processed for representing an arbitrary impedance loading of the device under test. The method and apparatus calibrates the test probe to characterize transfer parameters of the device under test within a spectral domain. A reflection coefficient (?L) is defined representative of an arbitrary impedance load coupled to the device under test and a response filter is computed to represent the loading of the device under test by the arbitrary impedance. Additional acquired samples are acquired using the response filter to effect thereby a representation of the arbitrary impedance loading of the device under test.

Abstract: Apparatus for rapidly acquiring a large number of samples of a signal under test, stores the samples in a waveform memory without converting the samples to binary form. The signal under test is applied to an arrangement of comparators and exclusive-OR gates to provide a signal indicative of amplitude. The waveform memory is arranged in rows and columns. In one embodiment, the amplitude-indicative signal serves as a row address signal for the waveform memory, and a scanning control signal serves as a column address signal for the waveform memory. In another embodiment, an X-Y display is produced in which the column address signal is responsive to the amplitude of a second signal under test.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that loading effects of the probe are substantially removed from the measurement.

Abstract: A method and apparatus adapted to calibrate a test probe and oscilloscope system such that loading effects of the probe are substantially removed from the measurement.

Abstract: A method and apparatus for selectively providing bandwidth extension and channel matching for acquired signals under test (SUT). The method and apparatus includes a signal acquisition device for acquiring a signal under test (SUT) and generating therefrom a stream of acquired samples, where the signal acquisition device having associated with it a first bandwidth defining a nominal pass band. At least one digital filter imparts a gain equalization function to the acquired SUT samples within a spectral region including and extending beyond the nominal passband. A controller generates a display signal suitable for use by a display device, where the display signal representing waveform imagery associated with the gain equalized SUT.