Patents by Inventor John QUAEDACKERS

John QUAEDACKERS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measuring a height map of a test surface
    Patent number: 11493330
    Abstract: A method for measuring a height map of a test surface having a varying reflectivity using a multi-sensor apparatus including a pre-scan sensor and a height measuring sensor is disclosed. The multi-sensor apparatus further comprises one or more light sources configured to illuminate the test surface and a spatial light modulator. The spatial light modulator is placed in a light path between the one or more light sources and a measuring location of the multi-sensor apparatus and is configured to modulate light emitted from at least one of the light sources. The method comprises performing a measurement for determining an illumination intensity map of the test surface and a measurement for performing a height map of the test surface.
    Type: Grant
    Filed: December 11, 2020
    Date of Patent: November 8, 2022
    Assignee: MITUTOYO CORPORATION
    Inventors: Hendrik Ketelaars, Adriaan Tiemen Zuiderweg, Lukasz Redlarski, John Quaedackers
  • METHOD FOR MEASURING A HEIGHT MAP OF A TEST SURFACE
    Publication number: 20210180943
    Abstract: A method for measuring a height map of a test surface having a varying reflectivity using a multi-sensor apparatus including a pre-scan sensor and a height measuring sensor is disclosed. The multi-sensor apparatus further comprises one or more light sources configured to illuminate the test surface and a spatial light modulator. The spatial light modulator is placed in a light path between the one or more light sources and a measuring location of the multi-sensor apparatus and is configured to modulate light emitted from at least one of the light sources. The method comprises performing a measurement for determining an illumination intensity map of the test surface and a measurement for performing a height map of the test surface.
    Type: Application
    Filed: December 11, 2020
    Publication date: June 17, 2021
    Applicant: MITUTOYO CORPORATION
    Inventors: Hendrik KETELAARS, Adriaan Tiemen ZUIDERWEG, Lukasz REDLARSKI, John QUAEDACKERS