Patents by Inventor John R. Kuban

John R. Kuban has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing architecture with independent scan paths
    Patent number: 5428622
    Abstract: A scan test architecture includes first and second serial scan paths for transferring test data to and from an integrated circuit's logic. A first clock controls transfer of information on the first scan path and a second clock controls transfer of data on the second scan path. The first and second clocks are alternately enabled by a control signal initiated under program control of the external test system.
    Type: Grant
    Filed: March 5, 1993
    Date of Patent: June 27, 1995
    Assignee: Cyrix Corporation
    Inventors: John R. Kuban, Robert D. Maher, III