Patents by Inventor John R. O'Keefe

John R. O'Keefe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multifunctional fourier transform infrared spectrometer system
    Patent number: 6667808
    Abstract: A multifunctional infrared spectrometer system has an interferometer which receives the infrared beam from a source and provides a modulated output beam on beam paths to multiple spatially separated infrared detectors. A multi-position mirror element mounted at a junction position receives the beam on a main beam path and directs it on branch beam paths to sample positions, with the beam then being directed on the branch beam path to one of the detectors. One of the branch beam paths may include a sample holder at the sample position which can index between a position at which a sample is analyzed, to a reference material position, to a pass-through position for calibration purposes.
    Type: Grant
    Filed: February 20, 2001
    Date of Patent: December 23, 2003
    Assignee: Thermo Electron Scientific Instruments Corporation
    Inventors: Todd R. Clermont, Francis Jerome Deck, Louie Delaware, James Ronald Hyatt, George Douglas Jones, Gabor John Kemeny, Steven Ralph Lowry, William Joseph McCarthy, John R. O'Keefe
  • Multifunctional fourier transform infrared spectrometer system
    Publication number: 20010035957
    Abstract: A multifunctional infrared spectrometer system has an interferometer which receives the infrared beam from a source and provides a modulated output beam on beam paths to multiple spatially separated infrared detectors. A multi-position mirror element mounted at a junction position receives the beam on a main beam path and directs it on branch beam paths to sample positions, with the beam then being directed on the branch beam path to one of the detectors. One of the branch beam paths may include a sample holder at the sample position which can index between a position at which a sample is analyzed, to a reference material position, to a pass-through position for calibration purposes.
    Type: Application
    Filed: February 20, 2001
    Publication date: November 1, 2001
    Inventors: Todd R. Clermont, Francis Jerome Deck, Louie Delaware, James Ronald Hyatt, George Douglas Jones, Gabor John Kemeny, Steven Ralph Lowry, William Joseph McCarthy, John R. O'Keefe