Patents by Inventor John Robert Brehm

John Robert Brehm has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system to inspect a component
    Patent number: 7065176
    Abstract: A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.
    Type: Grant
    Filed: May 28, 2003
    Date of Patent: June 20, 2006
    Assignee: General Electric Company
    Inventors: Kevin Moermond, Andy Joseph Galish, John Robert Brehm, Francis Howard Little, Dean Fredrich Graber, Michael Timothy La Tulippe, Ronald Cecil McFarland
  • Multiple focal spot X-ray inspection system
    Patent number: 6895079
    Abstract: An X-ray inspection system includes an X-ray source that generates more than one beam defining an inspection plane, the beams being substantially parallel to each other; an X-ray detector having a plurality of detector arrays, each of which is aligned with one of the beams, and structure for supporting an object between the X-ray source and the X-ray detector. The X-ray source includes an electron gun and a device for steering an electron beam generated by the gun to multiple focal spots on a target.
    Type: Grant
    Filed: August 20, 2002
    Date of Patent: May 17, 2005
    Assignee: General Electric Company
    Inventors: Thomas William Birdwell, John Robert Brehm, Andrew Joseph Galish
  • METHOD AND SYSTEM TO INSPECT A COMPONENT
    Publication number: 20040240607
    Abstract: A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.
    Type: Application
    Filed: May 28, 2003
    Publication date: December 2, 2004
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Kevin Moermond, Andy Joseph Galish, John Robert Brehm, Francis Howard Little, Dean Fredrich Graber, Michael Timothy La Tulippe, Ronald Cecil McFarland
  • Multiple focal spot X-ray inspection system
    Publication number: 20040037393
    Abstract: An X-ray inspection system is provided comprising an X-ray source having means for generating more than one beam defining an inspection plane, the beams being substantially parallel to each other; an X-ray detector having a plurality of detector arrays, each of which is aligned with one of the beams, and means for supporting an object between the X-ray source and the X-ray detector. The means for generating more than one beam may include an electron gun and means for steering an electron beam generated by the gun to multiple focal spots on a target.
    Type: Application
    Filed: August 20, 2002
    Publication date: February 26, 2004
    Applicant: General Electric Company
    Inventors: Thomas William Birdwell, John Robert Brehm, Andrew Joseph Galish