Abstract: The present disclosure provides compositions and therapies that can address both the symptoms and disorders associated with insufficient surfactant production and hyperoxia. In one embodiment, the composition can be formulated for aerosol delivery during ventilation therapy. The composition can comprise one or more of the following: a PPAR gamma agonist, a surfactant peptide, and one or more phospholipids. The compositions are formulated to provide the complementary benefits of reducing the likelihood of developing or the severity of RDS in infants, as well as protecting and promoting lung maturation in a hyperoxic environment.

Abstract: The present disclosure describes a technique for debugging an integrated circuit having a parallel scan-chain architecture. Blocking circuits are introduced at the inputs and/or outputs of scan-chain branches. The blocking circuits allow the inputs to and/or the outputs from the scan-chain branches to be selectively blocked. This allows individual scan-chain branches to be isolated and debugged.

Abstract: The present disclosure describes a technique for debugging an integrated circuit having a parallel scan-chain architecture. Blocking circuits are introduced at the inputs and/or outputs of scan-chain branches. The blocking circuits allow the inputs to and/or the outputs from the scan-chain branches to be selectively blocked. This allows individual scan-chain branches to be isolated and debugged.

Abstract: This invention improves and simplifies prior art systems for automatic test generation methodologies. In this invention, combinational logic is used to prevent opposing tristate bus drivers from simultaneously providing a logic signal on a common bus during testing of an integrated circuit. The combinational logic also ensures that at most one tristate buffer is enabled at all times during testing to ensure the common bus is at either a full logical 1, logical 0, or non-driven state. By preventing opposing drive signals being applied to the common bus and thus ensuring the bus is at a full logical 1 or logical 0 state when driven, automatic test generation programs can accurately generate test vectors for the integrated circuit.