Patents by Inventor John S. Watanabe

John S. Watanabe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for custom-made clothing
    Patent number: 7058471
    Abstract: A garment facility produces custom-made garments according to the body contour and the fit preferences of a customer. Try-on garments for various styles of garments are presented to customers for selection. The tailor will retrieve the one or more base patterns associated with the try-on garment. The pieces of the base patterns are marked and modified according to both the body contour and the fit preferences of a customer and connected as sample garment for try-on. The marked pieces are recorded and sent to a cutting machine as digital data. Multiple try-on garments can be combined to form new sample garments. A favorite garment of the customer can be recorded as digital data to re-produce the custom-made garments.
    Type: Grant
    Filed: January 14, 2003
    Date of Patent: June 6, 2006
    Inventor: John S. Watanabe
  • System and method for inspecting custom-made clothing
    Patent number: 6925350
    Abstract: A garment facility produces custom-made garments according to the body contour and the fit preferences of a customer. Marked pieces designed by a tailor are recorded, along with inspection marks, and sent to a cutting machine as digital design data. The inspection marks in the digital design data are used to ensure proper cutting of the custom-made garment pieces. The completed custom-made garment is also inspected using the inspection marks.
    Type: Grant
    Filed: January 22, 2004
    Date of Patent: August 2, 2005
    Inventor: John S. Watanabe
  • System and method for custom-made clothing
    Publication number: 20040158345
    Abstract: A garment facility produces custom-made garments according to the body contour and the fit preferences of a customer. Try-on garments for various styles of garments are presented to customers for selection. The tailor will retrieve the one or more base patterns associated with the try-on garment. The pieces of the base patterns are marked and modified according to both the body contour and the fit preferences of a customer and connected as sample garment for try-on. The marked pieces are recorded and sent to a cutting machine as digital data. Multiple try-on garments can be combined to form new sample garments. A favorite garment of the customer can be recorded as digital data to re-produce the custom-made garments.
    Type: Application
    Filed: January 14, 2003
    Publication date: August 12, 2004
    Inventor: John S. Watanabe
  • System and method for inspecting custom-made clothing
    Publication number: 20040153195
    Abstract: A garment facility produces custom-made garments according to the body contour and the fit preferences of a customer. Marked pieces designed by a tailor are recorded, along with inspection marks, and sent to a cutting machine as digital design data. The inspection marks in the digital design data are used to ensure proper cutting of the custom-made garment pieces. The completed custom-made garment is also inspected using the inspection marks.
    Type: Application
    Filed: January 22, 2004
    Publication date: August 5, 2004
    Inventor: John S. Watanabe