Abstract: A photonic device comprises a plurality of resonators and a plurality of optical channels. Each resonator from the plurality of resonators has a set of resonance frequencies independently selected from a set of resonance frequencies of each remaining resonator from the plurality of resonators. Each resonator from the plurality of resonators lacks substantially any linear coupling between each remaining resonator from the plurality of resonators. The plurality of resonators defines a spatial overlap region between at least two resonators from the plurality of resonators such that nonlinear optical processes are substantially optimized during operation. A plurality of optical channels is operatively coupled to the plurality of resonators. The plurality of optical channels is configured to receive light from the plurality resonators and configured to send light into the plurality of resonators.

Abstract: A photonic device comprises a plurality of resonators and a plurality of optical channels. Each resonator from the plurality of resonators has a set of resonance frequencies independently selected from a set of resonance frequencies of each remaining resonator from the plurality of resonators. Each resonator from the plurality of resonators lacks substantially any linear coupling between each remaining resonator from the plurality of resonators. The plurality of resonators defines a spatial overlap region between at least two resonators from the plurality of resonators such that nonlinear optical processes are substantially optimized during operation. A plurality of optical channels is operatively coupled to the plurality of resonators. The plurality of optical channels is configured to receive light from the plurality resonators and configured to send light into the plurality of resonators.

Abstract: A method is presented for determining an offset frequency of a frequency comb. The method includes: generating a beam of light with a waveform that repeats regularly in the time domain and exhibits a frequency comb in the frequency domain; directing the beam of light towards a point of incidence on a material; and detecting oscillation of a photocurrent in the material that is caused by the beam of light. Of note, the beam of light has an optical bandwidth that includes light propagating at a first frequency and at a second frequency, where the first frequency is less than the second frequency and the ratio of the second frequency to the first frequency is n:m, where n=m+i, m is an integer greater than one, and n and i are positive integers. Additionally, the material has a band gap and the band gap is not more than n times the first frequency.

Abstract: A method is presented for determining an offset frequency of a frequency comb. The method includes: generating a beam of light with a waveform that repeats regularly in the time domain and exhibits a frequency comb in the frequency domain; directing the beam of light towards a point of incidence on a material; and detecting oscillation of a photocurrent in the material that is caused by the beam of light. Of note, the beam of light has an optical bandwidth that includes light propagating at a first frequency and at a second frequency, where the first frequency is less than the second frequency and the ratio of the second frequency to the first frequency is n:m, where n=m+i, m is an integer greater than one, and n and i are positive integers. Additionally, the material has a band gap and the band gap is not more than n times the first frequency.

Abstract: The invention features methods and diffraction-based devices for the detection of specific analytes. The devices of the invention contain a periodic dielectric multilayer, which allows for the propagation of Bloch surface waves (BSWs) at the surface of the multilayer, thereby increasing the sensitivity of the device.

Abstract: The invention features methods and diffraction-based devices for the detection of specific analytes. The devices of the invention contain a periodic dielectric multilayer, which allows for the propagation of Bloch surface waves (BSWs) at the surface of the multilayer, thereby increasing the sensitivity of the device.

Abstract: A sensor includes at least one high refractive index layer; and at least one low refractive index layer coupled to the high refractive index layer.