Patents by Inventor John Spencer Baskin

John Spencer Baskin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for electron microscope with multiple cathodes
    Patent number: 9464998
    Abstract: An electron microscope system includes a laser system operable to generate an optical pulse and a pump pulse and a microscope column. The microscope column includes a multiple cathode structure having a plurality of spatially separated cathode regions. Each of the cathode regions are operable to generate an electron pulse. The microscope column also includes an electron acceleration region adjacent the multiple cathode structure, a specimen region operable to support a specimen, and a detector.
    Type: Grant
    Filed: June 19, 2015
    Date of Patent: October 11, 2016
    Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGY
    Inventors: Ahmed H. Zewail, John Spencer Baskin, Haihua Liu
  • METHOD AND SYSTEM FOR ELECTRON MICROSCOPE WITH MULTIPLE CATHODES
    Publication number: 20160005566
    Abstract: An electron microscope system includes a laser system operable to generate an optical pulse and a pump pulse and a microscope column. The microscope column includes a multiple cathode structure having a plurality of spatially separated cathode regions. Each of the cathode regions are operable to generate an electron pulse. The microscope column also includes an electron acceleration region adjacent the multiple cathode structure, a specimen region operable to support a specimen, and a detector.
    Type: Application
    Filed: June 19, 2015
    Publication date: January 7, 2016
    Inventors: Ahmed H. Zewail, John Spencer Baskin, Haihua Liu
  • Control imaging methods in advanced ultrafast electron microscopy
    Patent number: 8766181
    Abstract: An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror.
    Type: Grant
    Filed: May 13, 2013
    Date of Patent: July 1, 2014
    Assignee: California Institute of Technology
    Inventors: Ahmed H. Zewail, John Spencer Baskin
  • CONTROL IMAGING METHODS IN ADVANCED ULTRAFAST ELECTRON MICROSCOPY
    Publication number: 20140131574
    Abstract: An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror.
    Type: Application
    Filed: May 13, 2013
    Publication date: May 15, 2014
    Applicant: CALIFORNIA INSTITUTE OF TECHNOLOGY
    Inventors: Ahmed H. Zewail, John Spencer Baskin