Patents by Inventor John T. Barr, IV

John T. Barr, IV has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4816767
    Abstract: An RF network analyzer is disclosed which is suitable for both laboratory and automated production measurements. An important feature of the invention is the ability of the user to completely specify the method of calibration to be used. In particular the user can select any three arbitrary RF standards having known electromagnetic response characteristics and can attach them in any arbitrary order to perform the calibration of the instrument. This calibration is carried out by measuring the RF scattering parameters S.sub.11, S.sub.21, S.sub.12, and S.sub.22, storing the data in a memory, and then calculating vector error correction coefficients that are characteristic of systematic errors introduced by the RF network analyzer into measured scattering parameters.
    Type: Grant
    Filed: September 11, 1986
    Date of Patent: March 28, 1989
    Assignee: Hewlett-Packard Company
    Inventors: Wayne C. Cannon, John T. Barr, IV
  • Patent number: 4669051
    Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully coordinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.
    Type: Grant
    Filed: January 9, 1984
    Date of Patent: May 26, 1987
    Assignee: Hewlett-Packard Company
    Inventor: John T. Barr, IV
  • Patent number: 4661767
    Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully coordinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.
    Type: Grant
    Filed: January 9, 1984
    Date of Patent: April 28, 1987
    Assignee: Hewlett-Packard Company
    Inventors: David D. Sharrit, Michael J. Neering, S. Bruce Donecker, Mark D. Roos, Wayne C. Cannon, John T. Barr, IV
  • Patent number: 4641086
    Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully corrdinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.
    Type: Grant
    Filed: January 9, 1984
    Date of Patent: February 3, 1987
    Assignee: Hewlett-Packard Company
    Inventors: John T. Barr, IV, Michael J. Neering, Douglas E. Fullmer, Roger P. Oblad, Wayne C. Cannon, Glenn E. Elmore
  • Patent number: 4636717
    Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully coordinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.
    Type: Grant
    Filed: January 9, 1984
    Date of Patent: January 13, 1987
    Assignee: Hewlett-Packard Company
    Inventors: David D. Sharrit, Robert G. Dildine, Mark D. Roos, John T. Barr, IV