Patents by Inventor John T. Gaskins
John T. Gaskins has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12209961Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.Type: GrantFiled: March 23, 2023Date of Patent: January 28, 2025Assignee: University of Virginia Patent FoundationInventors: Brian M. Foley, John T. Gaskins, Patrick E. Hopkins
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Publication number: 20240410844Abstract: A method of measuring thermal conductivity of a material includes aiming a modulated pump laser beam having a modulation frequency low enough to induce a cyclical steady-state temperature rise having “on” and “off” state at a spot of a material, aiming a CW probe laser beam at the spot and generating a reflected probe beam reflected from the spot on the material, the reflected probe beam having a magnitude of a reflectance signal as a function of the temperature of the material and being periodic corresponding to the cyclical temperature rise, measuring the pump power difference and the reflectance signal magnitude difference between the “on” and “off” states, and calculating the thermal conductivity by fitting the measured power difference and the measured reflectance signal magnitude difference to a thermal model which is a function of a thermal conductivity of the material relating the heat flux to the temperature rise.Type: ApplicationFiled: August 21, 2024Publication date: December 12, 2024Inventors: Jeffrey L. Braun, David H. Olson, John T. Gaskins, Patrick E. Hopkins
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Patent number: 12092595Abstract: A method of measuring thermal conductivity of a material includes focusing a modulated pump laser beam having a modulation frequency that induces a cyclical steady-state temperature rise at a spot of a material, focusing a CW probe laser beam at the spot and generating a reflected probe beam reflected from the spot on the material, the reflected probe beam having a magnitude of a reflectance signal as a function of the temperature of the material and being periodic corresponding to the cyclical temperature rise, measuring the magnitude of the reflectance signals of the reflected probe beam, and determining the thermal conductivity by fitting the power of the pump beam and the measured magnitude of the reflectance signal to a thermal model which is a function of a thermal conductivity of the material relating the radial heat flux to the temperature rise.Type: GrantFiled: August 28, 2019Date of Patent: September 17, 2024Assignee: UNIVERSITY OF VIRGINIA PATENT FOUNDATIONInventors: Jeffrey L. Braun, David H. Olson, John T. Gaskins, Patrick E. Hopkins
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Publication number: 20230333015Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.Type: ApplicationFiled: March 23, 2023Publication date: October 19, 2023Inventors: Brian M. Foley, John T. Gaskins, Patrick E. Hopkins
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Patent number: 11635376Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.Type: GrantFiled: January 20, 2021Date of Patent: April 25, 2023Assignee: University of Virginia Patent FoundationInventors: Brian M. Foley, John T. Gaskins, Patrick E. Hopkins
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Publication number: 20220146443Abstract: A method of measuring thermal conductivity of a material includes focusing a modulated pump laser beam having a modulation frequency that induces a cyclical steady-state temperature rise at a spot of a material, focusing a CW probe laser beam at the spot and generating a reflected probe beam reflected from the spot on the material, the reflected probe beam having a magnitude of a reflectance signal as a function of the temperature of the material and being periodic corresponding to the cyclical temperature rise, measuring the magnitude of the reflectance signals of the reflected probe beam, and determining the thermal conductivity by fitting the power of the pump beam and the measured magnitude of the reflectance signal to a thermal model which is a function of a thermal conductivity of the material relating the radial heat flux to the temperature rise.Type: ApplicationFiled: August 28, 2019Publication date: May 12, 2022Applicant: UNIVERSITY OF VIRGINIA PATENT FOUNDATIONInventors: Jeffrey L. BRAUN, David H. OLSON, John T. GASKINS, Patrick E. HOPKINS
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Publication number: 20210140883Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.Type: ApplicationFiled: January 20, 2021Publication date: May 13, 2021Applicant: University of Virginia Patent FoundationInventors: Brian M. Foley, John T. Gaskins, Patrick E. Hopkins
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Patent number: 10928317Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.Type: GrantFiled: May 12, 2017Date of Patent: February 23, 2021Assignee: University of Virginia Patent FoundationInventors: Brian M. Foley, John T. Gaskins, Patrick E. Hopkins
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Publication number: 20190219503Abstract: An apparatus related method for measuring a property of a target material. The system may include a pump device that generates a pump beam. A modulation device may receive the pump beam and generate a modulated pump beam by modulating an intensity amplitude of the pump beam, which may be directed to the target material. A probe device may generate a probe beam, which is directed to the target material. A part of the probe beam may be reflected off of the target material, and has similar frequency characteristic as the modulated pump beam. A detection device may detect the reflected probe beam and produce a signal. An analyzing device may receive the signal and calculate the target material property by comparing the modulated frequency characteristics of the signal to those of the pump beam. At least one of the pump and the probe beams may be infrared light.Type: ApplicationFiled: May 12, 2017Publication date: July 18, 2019Applicant: University of Virginia Patent FoundationInventors: Brian M. Foley, John T. Gaskins, Patrick E. Hopkins