Abstract: A circuit comprising a sampling logic to sample an incoming signal. A phase detection logic to determine a phase error associated with the sample of the incoming signal and to output an out-of-phase detection signal based on the phase error. A control logic coupled to the phase detection logic to output a periodic error signal at a periodic rate. A phase adjustment logic to adjust the phase of the sampling logic based on the out-of-phase detection signal and the periodic error signal.

Abstract: A method to calibrate I/O cell current has been described. The method includes setting a global control value provided to the I/O cells. Then, for each I/O cell, the method includes comparing the logic voltage at the output pad of the I/O cell with a reference voltage, and sinking more current at the output pad by enabling additional driver bits associated with the I/O cell if the logic voltage is higher than the reference voltage, or sinking less current at the output pad by disabling additional driver bits associated with the I/O cell if the logic voltage is lower than the reference voltage.

Abstract: An apparatus and a method to control an output signal from a DAC-driven amplifier-based driver are disclosed. The apparatus includes an amplifier and a driver. The amplifier has a negative input terminal, a positive input terminal, and a first output terminal. The driver has an input terminal and a second output terminal, the input terminal coupled to the first output terminal of the amplifier and the second output terminal coupled to the positive input terminal of the amplifier to provide a positive feedback to the amplifier.

Abstract: An apparatus and a method to control an output signal from a DAC-driven amplifier-based driver are disclosed. The apparatus includes an amplifier and a driver. The amplifier has a negative input terminal, a positive input terminal, and a first output terminal. The driver has an input terminal and a second output terminal, the input terminal coupled to the first output terminal of the amplifier and the second output terminal coupled to the positive input terminal of the amplifier to provide a positive feedback to the amplifier.

Abstract: An apparatus and method for extending the PPM tolerance of data recovery circuits are herein described. The data recovery circuit including a loop with control logic coupled to the loop to change the rate at which the loop adjusts the phase of a sampler.

Abstract: A method to calibrate I/O cell current has been described. The method includes setting a global control value provided to the I/O cells. Then, for each I/O cell, the method includes comparing the logic voltage at the output pad of the I/O cell with a reference voltage, and sinking more current at the output pad by enabling additional driver bits associated with the I/O cell if the logic voltage is higher than the reference voltage, or sinking less current at the output pad by disabling additional driver bits associated with the I/O cell if the logic voltage is lower than the reference voltage.

Abstract: A local driver circuit to drive a logic voltage at an output pad includes an adder having K bits to add a K-bit control value to a local value, the adder producing a K-bit calibrated value. The circuit further includes K field-effect transistors (FETs), the drain of each FET being coupled to the output pad, and logic circuitry to perform a logical-AND function between a data input and the K-bit calibrated value. The logic circuitry providing a K-bit output with each of the K output bits being coupled to the gate of a corresponding one of the FETs. A comparator produces a correction value from a comparison of the logic voltage at the output pad and a reference voltage. A control unit sets a least significant bit (LSB) portion of the local value responsive to the correction value so as to make the logic voltage at the output pad in the reference voltage substantially equal.

Abstract: An apparatus which generates a clock signal includes a first phase mixer which generates an initial clock signal based on a first set of reference clocks and a buffer which adds a first predetermined delay to the initial clock signal to produce a first clock signal. A phase detection circuit detects a difference in phase between the first clock signal and a master clock signal, and a control circuit selects a second set of reference clocks based on the difference in phase and a second predetermined delay. A second phase mixer generates an output clock signal based on the second set of reference clocks.

Abstract: One aspect of the invention provides a novel scheme to improve channel jitter tolerance and perform data recovery across a serial data channel. In one implementation, the invention samples each data unit in the data channel multiple times and, using two data cycles, selects one of the samples as representative of the data unit. According to one aspect, the invention performs edge detection between adjacent data samples to determine the location of transitions between data units (bits). A representative data sample is chosen which is as far away as possible from the detected edge and the next expected edge and yet adjacent to, or equal to, the ideal current sample point. According to another aspect of the invention, as between two equally possible samples, the algorithm selects the sample which is furthest from the distribution of prior cycle edges.

Abstract: In general, one embodiment of the invention involves an apparatus that comprises a fast acquisition logic coupled to an oversampler. The fast acquisition logic is configured to detect whether any of a plurality of data samples produced by the oversampler is inaccurate, and if so, to cause data to be recovered from a new data sample different from the data sample previously being used for data recovery. The new data sample would be multiple sampling states away from the previous data sample.

Abstract: A method and apparatus for testing an input data path of an integrated circuit. Dual transmit and receive delay locked loops (DLLs) provide clocks for test mode data transmit and receive. Test mode logic drives a data pattern into an input receiver with the data pattern clocked by the transmit DLL and the input receiver clock by the receive DLL. The output of the input receiver is compared with the data pattern. The transmit DLL is adjusted relative to the receive DLL to measure setup and hold times of the data pattern driven through the input receiver.

Abstract: A local driver circuit to drive a logic voltage at an output pad includes an adder having K bits to add a K-bit control value to a local value, the adder producing a K-bit calibrated value. The circuit further includes K field-effect transistors (FETs), the drain of each FET being coupled to the output pad, and logic circuitry to perform a logical-AND function between a data input and the K-bit calibrated value. The logic circuitry providing a K-bit output with each of the K output bits being coupled to the gate of a corresponding one of the FETs. A comparator produces a correction value from a comparison of the logic voltage at the output pad and a reference voltage. A control unit sets a least significant bit (LSB) portion of the local value responsive to the correction value so as to make the logic voltage at the output pad in the reference voltage substantially equal.

Abstract: A method and circuit to test for defects in the input path of an integrated circuit by providing a logic pattern data to a scan chain of the integrated circuit and testing setup and hold timing parameters. The method including determining a maximum value for a timing parameter and generating a data pattern with the timing parameter having the maximum value. The method also including monitoring an output of a logic function performed on the data pattern and adjusting the value of the timing parameter based on the output of the logic function.