Abstract: A test interface is used to connect an electronic device under test (“DUT”), such as a computer chip, to a tester. The interface utilizes a combination of spring forces and air pressure forces to extend and retract pogo pins, respectively. The pogo pins when extended contact conductive pads which are electrically connected to the DUT, perhaps via a DUT board. Springs are biased to extend the pins to contact the pads, and air pressure is used to retract the pins. Thus no air pressure or vacuum is required to maintain the pins in contact with the pads. When retracted, the pogo pins are shielded from damage by a shield, such as a board with holes in it for the pogo pins to pass through.

Abstract: The present invention is an electrical clip-like connector that has a low profile and is capable of connecting the conductors of an electrical cable, for example, with the leads of an integrated circuit package or the like. Due to the low profile configuration of the invention, it may be used in situ in confined environments, and it also may be used for coupling relatively high speed signals without or with minimum antenna effect. Other features of the invention include a locating mechanism that facilitates applying the clip connector to an integrated circuit assuring proper alignment of the contacts and leads and a preferred contact/support arrangement to help assure good electrical connection with the integrated circuit leads and tolerance for size and location errors while avoiding overstress damage to the contacts.