Patents by Inventor John Timothy Strom

John Timothy Strom has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Coordinate calibration for scanning systems
    Patent number: 7062091
    Abstract: A scanning system is calibrated to correct for possible panel misalignments errors. A reference slide or data point is used to obtain a series of measurements with the scanning system. These measurements are compared with the expected results to determine systematic alignment errors in the scanning system. A model is created to correct the alignment errors during the scanning process, thus providing a plurality of more accurate scans. The plurality of scans may then be assembled to create a complete image of the scan area.
    Type: Grant
    Filed: January 14, 2002
    Date of Patent: June 13, 2006
    Assignee: Applied Precision, LLC
    Inventors: Carl S. Brown, Ray H. Kraft, John Timothy Strom, Mark D. Cavelero
  • Coordinate calibration for scanning systems
    Publication number: 20020097898
    Abstract: A scanning system is calibrated to correct for possible panel misalignments errors. A reference slide or data point is used to obtain a series of measurements with the scanning system. These measurements are compared with the expected results to determine systematic alignment errors in the scanning system. A model is created to correct the alignment errors during the scanning process, thus providing a plurality of more accurate scans. The plurality of scans may then be assembled to create a complete image of the scan area.
    Type: Application
    Filed: January 14, 2002
    Publication date: July 25, 2002
    Inventors: Carl S. Brown, Ray H. Kraft, John Timothy Strom, Mark D. Cavelero
  • Method and process of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing analysis, and manufacture
    Publication number: 20020097062
    Abstract: By examining the scrub mark properties (position and size) directly, the performance of a wafer probing process is evaluated. The scrub mark images are captured, the image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.
    Type: Application
    Filed: October 27, 2001
    Publication date: July 25, 2002
    Inventor: John Timothy Strom