Abstract: A synthetic test circuit, comprising: a device under test including a chain-link converter under test, comprising a plurality of test modules, each test module including module switches connected with an energy storage device; a terminal connected to the device under test; at least one injection circuit operably connected to the terminal, the injection circuit including a source, the source including a source chain-link converter, which includes a plurality of source modules, each source module including a plurality of module switches connected with at least one energy storage device; a controller being configured to operate each source module to selectively bypass the corresponding energy storage device and insert the corresponding energy storage device into the corresponding source chain-link converter so as to generate a voltage across the source chain-link converter and thereby operate the injection circuit to inject a current waveform and/or a voltage waveform into the chain-link converter under test.

Abstract: A synthetic test circuit, for performing an electrical test on a device under test, is provided. The circuit includes a terminal connectable to the device under test; a voltage injection circuit-operably connected to the terminal, the voltage injection circuit including a voltage source, the voltage source including a chain-link converter, the chain-link converter including a plurality of modules, each module including a plurality of module switches connected with at least one energy storage device; and a controller-configured to operate each module of the voltage injection circuit to selectively bypass the or each corresponding energy storage device and insert the or each corresponding energy storage device into the chain-link converter so as to generate a voltage across the chain-link converter and thereby operate the voltage injection circuit to inject a unidirectional voltage waveform into the device under test.