Abstract: Systems and methods for using metrology to assist a user at a workstation to form a part into a desired contour include scanning the part to obtain scanned data indicative of an actual contour of the part. Distance errors are determined based on a comparison of the scanned data to a computer model of the desired contour. A contour map of deviation is determined based on the distance errors, with the contour map of deviation indicating magnitudes of the distance errors for at least a selected set of points on the actual contour of the part. Visible indicium is projected onto the part that represents the contour map of deviation, thereby assisting the user of the workstation to identify where further modification of the actual contour is needed.

Abstract: Systems and methods of inspecting a manufactured part include creating a computer model of the part with a desired model contour having a model feature at a desired location. The manufactured part is scanned to obtain scanned data indicative of a manufactured surface formed in a manufactured contour and having a manufactured feature at an actual location on the manufactured surface. The computer model is modified using modeled reaction forces so that the model contour matches the manufactured surface. A determination whether the manufactured part is acceptable is based on a comparison of the actual location of the manufactured feature with and the desired location of the model feature with the model surface in the modified model contour. Additionally or alternatively, the reaction forces are compared with a reaction force threshold to determine whether the manufactured part requires reworking.

Abstract: Systems and methods for using metrology to assist a user at a workstation to form a part into a desired contour include scanning the part to obtain scanned data indicative of an actual contour of the part. Distance errors are determined based on a comparison of the scanned data to a computer model of the desired contour. A contour map of deviation is determined based on the distance errors, with the contour map of deviation indicating magnitudes of the distance errors for at least a selected set of points on the actual contour of the part. Visible indicium is projected onto the part that represents the contour map of deviation, thereby assisting the user of the workstation to identify where further modification of the actual contour is needed.

Abstract: Systems and methods of inspecting a manufactured part include creating a computer model of the part with a desired model contour having a model feature at a desired location. The manufactured part is scanned to obtain scanned data indicative of a manufactured surface formed in a manufactured contour and having a manufactured feature at an actual location on the manufactured surface. The computer model is modified using modeled reaction forces so that the model contour matches the manufactured surface. A determination whether the manufactured part is acceptable is based on a comparison of the actual location of the manufactured feature with and the desired location of the model feature with the model surface in the modified model contour. Additionally or alternatively, the reaction forces are compared with a reaction force threshold to determine whether the manufactured part requires reworking.

Abstract: A method for determining the positional laydown accuracy of an automated lamination machine during fabrication of a multiple layered part is described. The method includes measuring a position of a placement head of the lamination machine in a coordinate system, determining a location of a ply edge with respect to the placement head, transforming the location of the ply edge into the coordinate system, based on the measured head position, transforming the location of the ply edge from the coordinate system into a second coordinate system that is associated with the part being fabricated, and comparing actual ply edge location in the second coordinate system to an expected ply edge location defined in the second coordinate system, the second coordinate system associated with the part being fabricated, to determine the laydown accuracy of the machine.

Abstract: A method for determining the positional laydown accuracy of an automated lamination machine during fabrication of a multiple layered part is described. The method includes measuring a position of a placement head of the lamination machine in a coordinate system, determining a location of a ply edge with respect to the placement head, transforming the location of the ply edge into the coordinate system, based on the measured head position, transforming the location of the ply edge from the coordinate system into a second coordinate system that is associated with the part being fabricated, and comparing actual ply edge location in the second coordinate system to an expected ply edge location defined in the second coordinate system, the second coordinate system associated with the part being fabricated, to determine the laydown accuracy of the machine.

Abstract: A projector system having a process utilizing three-dimensional data, thereby allowing the system to account for rotational and translational differences between the projector and the object upon which the laser light is directed. Reference targets located on the object are in a known relationship to the projected three dimensional data. The reference targets are retro-reflective, such that light steered by the projector, when impinging on the reference targets, will return to the projector for detection and determination of the relative translation and orientation between projector and object. The three-dimensional data is then converted to a format suitable for projection using said translation and orientation information.

Abstract: A projection system having a process utilizing three-dimensional data, thereby allowing the system to account for rotational and translational differences between the projector and the object upon which the laser light is directed. Reference sensors located on the object are in a known relationship to the three-dimensional data set to be projected, i.e., the reference sensors utilize the same coordinate system as the three-dimensional data set.

Abstract: A projection system having a process utilizing three-dimensional data, thereby allowing the system to account for rotational and translational differences between the projector and the object upon which the laser light is directed. Reference sensors located on the object are in a known relationship to the three-dimensional data set to be projected, i.e., the reference sensors utilize the same coordinate system as the three-dimensional set.

Abstract: A projection system having a process utilizing three-dimensional data, thereby allowing the system to account for rotational and translational differences between the projector and the object upon which the laser light is directed. Reference sensors located on the object are in a known relationship to the three-dimensional data set to be projected, i.e., the reference sensors utilize the same coordinate system as the three-dimensional data set.

Abstract: A projection system having a process utilizing three-dimensional data, thereby allowing the system to account for rotational and translational differences between the projector and the object upon which the laser light is directed. Reference sensors located on the object are in a known relationship to the three-dimensional data set to be projected, i.e., the reference sensors utilize the same coordinate system as the three-dimensional data set.

Abstract: A method for determining proper operation of a multi-section photo-sensitive detector (10) includes measuring (102) the cathode-anode dark resistance of each section and rejecting the detector (104, 108) if any section measures less than a predetermined value or if the ratio of the dark resistance of any section to the section having the highest dark resistance (106) exceeds a specified level. Each detector is also subjected to anode-to-anode or cathode-to-cathode dark resistance testing for both adjacent (110) and non-adjacent (124) sections, with testing based on comparisons between section pair readings and the sum of the cathode-anode dark resistances of each section in the tested pair (114, 128).