Abstract: A measuring machine (100) having a movable horizontal arm (130) and a vertical column (120) for mounting a probe (140) with respect to a table (110), the arm and column each including means for measuring relative displacement of the arm. The measuring means for the arm or column includes a scale (200, 400) and a vernier (300, 500) (one fixed and one movable with the arm or column), wherein the scales for the horizontal arm and the vertical column are substantially identical and interchangeable and include reference numerals (220, 420) which are positioned at an incline (or acute angle) of approximately 45 degrees with respect to the length of the scales and the arm movement. Lead lines (230, 430) having a similarly angled or inclined portion extend from adjacent each reference numeral toward a measurement division indicator (measurement indicia) (210, 410).

Abstract: A probe assembly is disclosed carrying a grid grating and an index grating adapted to generate a Moire pattern upon relative movement in either or both of two orthogonal directions in a common plane. The index and grid gratings are supported for precise orthogonal motion with respect to each other by means of a pair of grating support assemblies mounted so that the correct index and grid grating spacing and orientation are precisely maintained, including a cross-slide assembly provided to allow movement in a plane while maintaining the proper orientation between the grating assemblies.