Patents by Inventor John W. Lewellen
John W. Lewellen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11810774Abstract: A method for making field emission devices so that they have emitter tips in the form of a needle-like point with a width and length configured such that ratio of the width to the length ranges from about 0.001 to about 0.05, and associated methods for making the tips by 3-D printing.Type: GrantFiled: August 26, 2021Date of Patent: November 7, 2023Assignee: Government of the United States as represented by the Secretary of the Air ForceInventors: Joseph M. Connelly, John R. Harris, John W. Lewellen
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Patent number: 11527806Abstract: A waveguide flange adapter includes a plate; an aperture positioned through the plate; and a plurality of holes arranged in a pattern in the plate and around the aperture. The plate is configured to operatively connect a first waveguide to a second waveguide such that the first waveguide and the second waveguide have a different pattern of holes on the waveguide flanges to one another. The pattern of the plurality of holes may be configured to align with connecting holes in each of the first waveguide and the second waveguide. At least some of the plurality of holes may extend through an entire thickness of the plate. The plate may include electrically-conductive material. The size and shape of the aperture may be complementary to a size and shape of each of the first waveguide and the second waveguide. At least some of the plurality of holes may be tapped or untapped.Type: GrantFiled: June 4, 2020Date of Patent: December 13, 2022Assignee: United States of America as represented by the Secretary of the Air ForceInventors: John W. Lewellen, Rufus Cooksey, John R. Harris
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Publication number: 20220068584Abstract: A method for making field emission devices so that they have emitter tips in the form of a needle-like point with a width and length configured such that ratio of the width to the length ranges from about 0.001 to about 0.05, and associated methods for making the tips by 3-D printing.Type: ApplicationFiled: August 26, 2021Publication date: March 3, 2022Applicant: Government of the United States, as represented by the Secretary of the Air ForceInventors: Joseph M. Connelly, John R. Harris, John W. Lewellen
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Patent number: 10211505Abstract: Provided is a resonant structure including a microwave cavity and a sideline radio-frequency (RF) power coupler including: an inner conductor; an outer conductor sharing a central axis with the inner conductor, the outer conductor being electrically coupled to an outer wall of the microwave cavity; and an insulation layer between the inner conductor and the outer conductor.Type: GrantFiled: June 6, 2017Date of Patent: February 19, 2019Assignee: Triad National Security, LLCInventors: John W. Lewellen, IV, Dinh Cong Nguyen, Cynthia Eileen Buechler, Gregory E. Dale, Dale Allen Dalmas
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Patent number: 7760054Abstract: An RF cavity is provided with a plurality of tubes that are formed into a tubular cage in a predefined shape to define the RF cavity. A selected number of tubes and a selected tube diameter are provided to form a confinement cage for the RF fields within the RF cavity defined by the tubes. The multiple, small metal tubes are selectively bent to form different cavity shapes and sizes as needed to accelerate the particles and function as a confinement cage for the RF fields within the RF cavity defined by the tubes. The cost to fabricate RF cavities using the tubular cage design is significantly lower than the cost of producing a solid cavity using conventional fabrication technology.Type: GrantFiled: May 10, 2007Date of Patent: July 20, 2010Assignee: UChicago Argonne, LLCInventors: John W. Lewellen, John Noonan, Terry L. Smith, Geoff Waldschmidt
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Patent number: 7573053Abstract: A method and an electron source are provided for generating polarized electrons for an electron microscope. The electron source includes a photoemissive cathode and a low-power drive laser. The geometry of the photoemissive cathode uses a generally planar emission surface, which is imaged to approximately 1/100 its initial size via electrostatic focusing elements. The virtual emitter, or image spot, then is used as an electron source by a conventional microscope column.Type: GrantFiled: January 22, 2007Date of Patent: August 11, 2009Assignee: UChicago Argonne, LLCInventors: John W. Lewellen, John Noonan
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Patent number: 7394201Abstract: A novel method of gating electron emission from field-emitter cathodes for radio frequency (RF) electrode guns and a novel cathode that provides a focused electron beam without the need for magnetic fields or a curved cathode surface are provided. The phase and strength of a predefined harmonic field, such as the 3rd harmonic field, are adjusted relative to a fundamental field to cause a field emission cathode to emit electrons at predefined times for the generation of high-brightness electron beams. The emission time is gated responsive to the combined harmonic and fundamental fields and the response of the FE cathode to the combined fields. A planar focusing cathode includes a selected dielectric material, such as a ceramic material, to provide an electron beam emission surface. Metal surfaces are provided both radially around and behind the dielectric material to shape the electric fields that accelerate and guide the beam from the cathode surface.Type: GrantFiled: October 11, 2005Date of Patent: July 1, 2008Assignee: UChicago Argonne, LLCInventors: John W. Lewellen, John Noonan
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Publication number: 20080042784Abstract: An RF cavity is provided with a plurality of tubes that are formed into a tubular cage in a predefined shape to define the RF cavity. A selected number of tubes and a selected tube diameter are provided to form a confinement cage for the RF fields within the RF cavity defined by the tubes. The multiple, small metal tubes are selectively bent to form different cavity shapes and sizes as needed to accelerate the particles and function as a confinement cage for the RF fields within the RF cavity defined by the tubes. The cost to fabricate RF cavities using the tubular cage design is significantly lower than the cost of producing a solid cavity using conventional fabrication technology.Type: ApplicationFiled: May 10, 2007Publication date: February 21, 2008Inventors: John W. Lewellen, John Noonan, Terry L. Smith, Geoff Waldschmidt
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Patent number: 7312461Abstract: A laparoscopic tumor therapy method and an articulated electron beam transport system are provided for use with a high power, long focus electron source for tumor therapy. The high power, long focus electron source generates an e-beam. The e-beam is transported through a laparoscopic tube proximate a target tumor for electron irradiation therapy.Type: GrantFiled: June 2, 2005Date of Patent: December 25, 2007Assignee: UChicago Argonne LLCInventors: John W. Lewellen, John Noonan
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Publication number: 20070228286Abstract: A method and an electron source are provided for generating polarized electrons for an electron microscope. The electron source includes a photoemissive cathode and a low-power drive laser. The geometry of the photoemissive cathode uses a generally planar emission surface, which is imaged to approximately 1/100 its initial size via electrostatic focusing elements. The virtual emitter, or image spot, then is used as an electron source by a conventional microscope column.Type: ApplicationFiled: January 22, 2007Publication date: October 4, 2007Inventors: John W. Lewellen, John Noonan
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Patent number: 7250727Abstract: Beam processing methods including e-beam welding and e-beam evaporation for thin film deposition are implemented with a novel high power, long focus electron source. The high power, long focus electron source generates an e-beam. The e-beam is transported through a series of steering magnets to steer the beam. At least one refocusing magnet is provided to refocus the e-beam. A final steering magnet bends the e-beam to focus on a target, such as a weld joint or a deposition target.Type: GrantFiled: June 2, 2005Date of Patent: July 31, 2007Assignee: UChicago Argonne LLCInventors: John W. Lewellen, John Noonan
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Patent number: 6987361Abstract: A novel method of gating electron emission from field-emitter cathodes for radio frequency (RF) electrode guns and a novel cathode that provides a focused electron beam without the need for magnetic fields or a curved cathode surface are provided. The phase and strength of a predefined harmonic field, such as the 3rd harmonic field, are adjusted relative to a fundamental field to cause a field emission cathode to emit electrons at predefined times for the generation of high-brightness electron beams. The emission time is gated responsive to the combined harmonic and fundamental fields and the response of the FE cathode to the combined fields. A planar focusing cathode includes a selected dielectric material, such as a ceramic material, to provide an electron beam emission surface. Metal surfaces are provided both radially around and behind the dielectric material to shape the electric fields that accelerate and guide the beam from the cathode surface.Type: GrantFiled: July 8, 2004Date of Patent: January 17, 2006Assignee: The University of ChicagoInventors: John W. Lewellen, John Noonan
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Patent number: 6911091Abstract: Systems and methods are described for environmental exchange control for a polymer on a wafer surface. An apparatus for controlling an exchange between an environment and a polymer on a surface of a wafer located in the environment includes: a chamber adapted to hold the wafer, define the environment, and maintain the polymer in an adjacent relationship with the environment; and a heater coupled to the chamber. A method for improving performance of a spin-on material includes: forming the spin-on material on a surface of a wafer; then locating the spin-on material in an environment so that said environment is adjacent said spin-on material; and then controlling an exchange between the spin-on material and said environment. The systems and methods provide advantages because inappropriate deprotection is mitigated by careful control of the environmental temperature and environmental species partial pressures (e.g. relative humidity).Type: GrantFiled: June 3, 2002Date of Patent: June 28, 2005Assignee: ASML Netherlands B.V.Inventors: Emir Gurer, Ed C. Lee, Tom Zhong, Kevin Golden, John W. Lewellen, Scott C. Wackerman, Reese Reynolds
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Patent number: 6844027Abstract: Systems and methods are described for environmental exchange control for a polymer on a wafer surface. An apparatus for controlling an exchange between an environment and a polymer on a surface of a wafer located in the environment includes: a chamber adapted to hold the wafer, define the environment, and maintain the polymer in an adjacent relationship with the environment; and a heater coupled to the chamber. A method for improving performance of a spin-on material includes: forming the spin-on material on a surface of a wafer; then locating the spin-on material in an environment so that said environment is adjacent said spin-on material; and then controlling an exchange between the spin-on material and said environment. The systems and methods provide advantages because inappropriate deprotection is mitigated by careful control of the environmental temperature and environmental species partial pressures (e.g. relative humidity).Type: GrantFiled: May 2, 2000Date of Patent: January 18, 2005Assignee: ASML Holding N.V.Inventors: Emir Gurer, Ed C. Lee, Tom Zhong, Kevin Golden, John W. Lewellen, Scott C. Wackerman, Reese Reynolds
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Patent number: 6780461Abstract: Systems and methods are described for environmental exchange control for a polymer on a wafer surface. An apparatus for controlling an exchange between an environment and a polymer on a surface of a wafer located in the environment includes: a chamber adapted to hold the wafer, define the environment, and maintain the polymer in an adjacent relationship with the environment; and a heater coupled to the chamber. A method for improving performance of a spin-on material includes: forming the spin-on material on a surface of a wafer; then locating the spin-on material in an environment so that said environment is adjacent said spin-on material; and then controlling an exchange between the spin-on material and said environment. The systems and methods provide advantages because inappropriate deprotection is mitigated by careful control of the environmental temperature and environmental species partial pressures (e.g. relative humidity).Type: GrantFiled: March 1, 2001Date of Patent: August 24, 2004Assignee: ASML Holding N.V.Inventors: Emir Gurer, Ed C. Lee, Tom Zhong, Kevin Golden, John W. Lewellen, Scott C. Wackerman, Reese Reynolds
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Patent number: 6662466Abstract: A process for drying a polymeric material present on a substrate is provided. Temperatures of the polymeric material is measured and the ambient temperature in the vicinity of the substrate. A temperature of the substrate is also measured. A variation in the measured ambient temperature is detected. The substrate temperature, polymeric temperature, ambient temperature or a substrate drying spin speed is adjusted in response to the detected variation in the measured ambient temperature.Type: GrantFiled: December 11, 2001Date of Patent: December 16, 2003Assignee: ASML Holdings, N.V.Inventors: Emir Gurer, Tom Zhong, John W. Lewellen, Eddie Lee
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Publication number: 20030010289Abstract: Systems and methods are described for environmental exchange control for a polymer on a wafer surface. An apparatus for controlling an exchange between an environment and a polymer on a surface of a wafer located in the environment includes: a chamber adapted to hold the wafer, define the environment, and maintain the polymer in an adjacent relationship with the environment; and a heater coupled to the chamber.Type: ApplicationFiled: June 3, 2002Publication date: January 16, 2003Inventors: Emir Gurer, Ed C. Lee, Tom Zhong, Kevin Golden, John W. Lewellen, Scott C. Wackerman, Reese Reynolds
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Patent number: 6468586Abstract: Systems and methods are described for environmental exchange control for a polymer on a wafer surface. An apparatus for controlling an exchange between an environment and a polymer on a surface of a wafer located in the environment includes: a chamber adapted to hold the wafer, define the environment, and maintain the polymer in an adjacent relationship with the environment; and a heater coupled to the chamber. A method for improving performance of a spin-on material includes: forming the spin-on material on a surface of a wafer; then locating the spin-on material in an environment so that said environment is adjacent said spin-on material; and then controlling an exchange between the spin-on material and said environment. The systems and methods provide advantages because inappropriate deprotection is mitigated by careful control of the environmental temperature and environmental species partial pressures (e.g. relative humidity).Type: GrantFiled: May 8, 2000Date of Patent: October 22, 2002Assignee: Silicon Valley Group, Inc.Inventors: Emir Gurer, Ed C. Lee, Tom Zhong, Kevin Golden, John W. Lewellen, Scott C. Wackerman, Reese Reynolds
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Publication number: 20020112370Abstract: A process for drying a polymeric material present on a substrate is provided. Temperatures of the polymeric material is measured and the ambient temperature in the vicinity of the substrate. A temperature of the substrate is also measured. A variation in the measured ambient temperature is detected. The substrate temperature, polymeric temperature, ambient temperature or a substrate drying spin speed is adjusted in response to the detected variation in the measured ambient temperature.Type: ApplicationFiled: December 11, 2001Publication date: August 22, 2002Inventors: Emir Gurer, Tom Zhong, John W. Lewellen, Eddie Lee
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Patent number: 6327793Abstract: A process for drying a polymeric material present on a substrate is provided. Temperatures of the polymeric material is measured and the ambient temperature in the vicinity of the substrate. A temperature of the substrate is also measured. A variation in the measured ambient temperature is detected. The substrate temperature, polymeric temperature, ambient temperature or a substrate drying spin speed is adjusted in response to the detected variation in the measured ambient temperature.Type: GrantFiled: March 20, 2000Date of Patent: December 11, 2001Assignee: Silicon Valley GroupInventors: Emir Gurer, Tom Zhong, John W. Lewellen, Eddie Lee