Patents by Inventor John W. Pattschull

John W. Pattschull has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for testing integrated circuits
    Patent number: 4567432
    Abstract: A system for statically and dynamically testing an integrated circuit die in wafer form at various temperatures includes a multilayer support fixture in which the probes, the static test switching circuitry, and the dynamic test switching circuitry are mounted on separate, spaced apart, planar layers detachably connected to one another, the probe and the probe support board being formed of materials having a low temperature coefficient of thermal expansion. A heated/cooled wafer positioning chuck controls the temperature of the wafer thereon during static and dynamic testing.
    Type: Grant
    Filed: June 9, 1983
    Date of Patent: January 28, 1986
    Assignee: Texas Instruments Incorporated
    Inventors: Douglas A. Buol, Dean N. Mize, John W. Pattschull, Robert M. Wallace