Patents by Inventor John W. Steck, Jr.

John W. Steck, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7423442
    Abstract: According to one embodiment of the invention, a method for early qualification of semiconductor device includes performing initial testing on a semiconductor device, receiving fail data on the semiconductor device, determining a solution model for the semiconductor device based on the fail data, storing the solution model, performing subsequent testing on the semiconductor device, and comparing a result of the subsequent testing to the solution model.
    Type: Grant
    Filed: July 22, 2005
    Date of Patent: September 9, 2008
    Assignee: Texas Instruments Incorporated
    Inventor: John W. Steck, Jr.