Abstract: Example embodiments relate to selective invalidation of packet filtering cache results based on rule priority. In example embodiments, a network node determines whether a rule identifier included in a cache entry of a cache of results of a packet filtering rule set is of a higher priority than a highest priority rule corresponding to a rule set version identifier included in the cache entry. If so, the network node may apply an action included in the cache entry.

Abstract: Methods and apparatus for performing, using smaller, more efficient shared logic circuitry, the parity checking function and the compare function in a mutually exclusive manner in different cycles of a ternary content addressable memory are disclosed.

Abstract: Example embodiments relate to selective invalidation of packet filtering cache results based on rule priority. In example embodiments, a network node determines whether a rule identifier included in a cache entry of a cache of results of a packet filtering rule set is of a higher priority than a highest priority rule corresponding to a rule set version identifier included in the cache entry. If so, the network node may apply an action included in the cache entry.

Abstract: A method for remedying data corruption in a first circuit, which may be a CAM or a TCAM. The method includes providing a RAM circuit external to the first circuit, the RAM circuit being configured for storing error detection information for data stored in the first circuit. The method also includes scrubbing the data stored in the first circuit during scrubbing cycles of the first circuit. The scrubbing corrects stored bit patterns read from the first circuit that fail an error detection test using error detection information corresponding to individual ones of the stored bit patterns. In an embodiment, ECC may be employed for the error detection test and also to correct any single bit error found.

Abstract: Methods and apparatus for performing, using smaller, more efficient shared logic circuitry, the parity checking function and the compare function in a mutually exclusive manner in different cycles of a ternary content addressable memory are disclosed.

Abstract: Methods and apparatus for performing, using smaller, more efficient shared logic circuitry, the parity checking function and the compare function in a mutually exclusive manner in different cycles of a ternary content addressable memory are disclosed.

Abstract: Methods and arrangements for parallel parity checking for content addressable memory and ternary content addressable memory during compare cycles are disclosed. Further, methods and arrangements for remedying storage bit corruption are also disclosed.

Abstract: A method stores data and check bits for that data within a memory chip. The memory chip stores the data and check bits in a plurality of pages contained in the memory chip, each page including a plurality of storage locations with each storage location having an associated address. The method includes receiving data to be stored in the memory, calculating check bits for the received data, mapping the data to addresses associated with the storage locations in a given page in the memory chip, mapping the check bits to addresses associated with the storage locations contained in the same page as the data, and storing the data and check bits in the page. The method may be applied to a single memory chip or to multiple memory chips.

Abstract: Methods and apparatus for performing, using smaller, more efficient shared logic circuitry, the parity checking function and the compare function in a mutually exclusive manner in different cycles of a ternary content addressable memory are disclosed.

Abstract: Methods and arrangements for parallel parity checking for content addressable memory and ternary content addressable memory during compare cycles are disclosed. Further, methods and arrangements for remedying storage bit corruption are also disclosed.

Abstract: A method for remedying data corruption in a first circuit, which may be a CAM or a TCAM. The method includes providing a RAM circuit external to the first circuit, the RAM circuit being configured for storing error detection information for data stored in the first circuit. The method also includes scrubbing the data stored in the first circuit during scrubbing cycles of the first circuit. The scrubbing corrects stored bit patterns read from the first circuit that fail an error detection test using error detection information corresponding to individual ones of the stored bit patterns. In an embodiment, ECC may be employed for the error detection test and also to correct any single bit error found.

Abstract: Systems, methods, and devices are disclosed that provide packet protection for header modification. One method includes receiving a packet to a computing device. The method includes apply error checking techniques independently to different portions of the packet.

Abstract: Systems, methods, and devices are provided for moving packets on a network device. One method includes receiving packets to a number of network chips, the number of network chips having a conduit port which can be selectively chosen to exchange packets with a processor responsible for processing packets. The method includes adding data for additional functionality to certain packets. Adding data includes encapsulating the certain packets to maintain an appearance of a certain packet format.

Abstract: In an embodiment of the invention, a method of providing redundancy in a ternary content addressable memory (TCAM) includes: detecting a defective entry in a ternary content addressable memory (TCAM); marking the defective entry so that the defective entry is visible to a software; and avoiding in using the defective entry. For data that normally would have been written into the defective entry, the data is written into an entry that is subsequent to the defective entry. In another embodiment, the redundancy is provided in a CAM instead of a TCAM.

Abstract: Methods, systems, and circuits are provided for monitoring multiple clock domains. One method for monitoring multiple clock domains includes pipelining different sets of signals from different clock domains on an application specific integrated circuit (ASIC) to a particular input/output (I/O) port on the ASIC using an associated clock from each different clock domain, and selecting a particular set of signals from among the different sets of signals to send out of the particular I/O port.

Abstract: Methods, systems, and circuits are provided for signals crossing multiple clock domains. One circuit includes a number of different clock domains located on different portions of the ASIC. A number of input/output (I/O) ports are provided to couple signals to and from the ASIC. The circuit includes means for moving internal signals from a subset of the number of different clock domains of multiple frequencies to a different clock domain for monitoring, observation, counting, and debug.

Abstract: Network devices and methods are provided for device monitoring. One embodiment includes a network device having a processor, a high speed interconnect and a number of network chips. The number of network chips are coupled to one another through the high speed interconnect. The number of network chips have a conduit port which can be selectively chosen to exchange packets, received to any network chip, with the processor.

Abstract: Network devices and methods are provided involving a support chip in association with network chips. One embodiment includes a network device having a processor, a high speed interconnect, and a number of network chips coupled to one another through the high speed interconnect. The number of network chips include a conduit port which can be selectively chosen to exchange packets, received to the number of network chips, with the processor. The support chip is coupled to the number of network chips in association with selecting a conduit port on one of the number of network chips to exchange packets with the processor.

Abstract: Application specific integrated circuits (ASICs) and methods are provided which allow for internal testing of an ASIC. One ASIC embodiment includes a processor on the ASIC. A memory is coupled to the processor. A test circuit is integrated on the ASIC and coupled to the processor to perform testing internal to the ASIC, the test circuit having an input to receive signals from the processor. The processor can read an output of the test circuit to determine a performance speed of the ASIC.