Abstract: Self-propelled hydrodynamic underwater toys with integrated propulsion mechanisms are described. In some embodiments, the propulsion mechanisms is partially or completely within an internal compartment in the toy's body. The propulsion mechanisms are adapted to be charged with a volume of fluid and to thereafter discharge the volume of fluid under pressure to propel the toy through a body of water. In some embodiments, the propulsion mechanism includes an expandable reservoir. In some embodiments, the propulsion mechanism is a replaceable propulsion mechanism. In some embodiments, the toy includes a trajectory-stabilizing structure that is adapted to impart at least one of a steering moment and a righting moment to the toy during underwater travel. The toy may be adapted to have positive, negative or neutral buoyancies, and can be adapted to maintain its buoyancy and/or its center of gravity while being propelled through a body of water by the propulsion system.

Abstract: Self-propelled hydrodynamic underwater toys with integrated propulsion mechanisms are described. In some embodiments, the propulsion mechanisms is partially or completely within an internal compartment in the toy's body. The propulsion mechanisms are adapted to be charged with a volume of fluid and to thereafter discharge the volume of fluid under pressure to propel the toy through a body of water. In some embodiments, the propulsion mechanism includes an expandable reservoir. In some embodiments, the propulsion mechanism is a replaceable propulsion mechanism. In some embodiments, the toy includes a trajectory-stabilizing structure that is adapted to impart at least one of a steering moment and a righting moment to the toy during underwater travel. The toy may be adapted to have positive, negative or neutral buoyancies, and can be adapted to maintain its buoyancy and/or its center of gravity while being propelled through a body of water by the propulsion system.

Abstract: An apparatus and method for controlling temperature during pre-delivery testing of microprocessors and integrated circuits wherein a testing package, including a thermally conductive lid overlying and in thermal contact with the microprocessor or integrated circuit, is covered by a block of thermally conductive material of predetermined thickness T, where T is a function of a desired temperature profile and, optionally, the current drawn by the microprocessor undergoing testing.

Abstract: A processor chip is tested by placing it on a modified system motherboard within a system test station The modified motherboard is able to operate as a fully functional PC motherboard with an operating system and application software. A socket is provided to allow the easy addition and removal of processor chips under test The test program for testing a processor chip is exercised as an application program and monitors and reports status of the test to the system test controller A thermal unit with a built in temperature controller is coupled to the system motherboard as via an I/O connector.

Abstract: Parametric test data is taken on a sampled set of a particular integrated circuit (IC) using both an Automatic Test Equipment (ATE) tester and a system test motherboard. The parametric test data comprises maximum operating frequency, maximum operating temperature and minimum operating power supply voltage. A maximum operating frequency is determined at a particular fixed operating temperature and power supply voltage. A maximum operating temperature is determined at a particular fixed operating frequency and power supply voltage. Finally, a minimum operating power supply voltage is determined at a particular fixed operating frequency and temperature. Multiple two parameter graphs are plotted and the slope or numerical derivative for each plot is calculated as conversion factors. During a normal production run for the particular IC performance limit data is taken on the ATE tester comprising the same three parameters of maximum operating frequency at a particular temperature and power supply voltage.