Patents by Inventor John Zabolitsky

John Zabolitsky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and an apparatus for measuring positions of contact elements of an electronic component
    Patent number: 7423743
    Abstract: A method and an apparatus for measuring respective positions of a set of N contact elements of an electronic component. A first and a second light path are created by a first and a second light beam which have different viewing angles. Both the first and the second light path can selectively be opened and both end into the image plane of a single camera. The positions being determined by using the first and second image produced by the first and second light beam respectively.
    Type: Grant
    Filed: January 2, 2002
    Date of Patent: September 9, 2008
    Assignee: Icos Vision Systems NV
    Inventors: Carl Smets, Karel Van Gils, John Zabolitsky, Jurgen Everaerts
  • Method and an apparatus for measuring positions of contact elements of an electronic component
    Publication number: 20040085549
    Abstract: A method and an apparatus for measuring respective positions of a set of N contact elements of an electronic component. A first and a second light path are created by a first and a second light beam which have different viewing angles. Both the first and the second light path can selectively be opened and both end into the image plane of a single camera. The positions being determined by using the first and second image produced by the first and second light beam respectively.
    Type: Application
    Filed: September 29, 2003
    Publication date: May 6, 2004
    Inventors: Carl Smets, Karel Van Gils, John Zabolitsky, Jurgen Everaerts