Patents by Inventor Jon A. Hample
Jon A. Hample has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 9772349Abstract: A circuit board tester and method that precisely aligns the probe plate and circuit board is disclosed. With a circuit board and probe plate mounting within a housing having a top and bottom, hinged together, at closure there may be slight misalignments of the two. By making one of the two plates floating, or laterally slideable with respect to each other, it is possible to make final alignment at closure. One of the two plates can be provided with a pin and the other with a pin receiving alignment block. With the lateral slideability, the pin and block can insure proper probe alignment. Additional systems for correcting misaligned pins or blocks are also disclosed.Type: GrantFiled: September 25, 2014Date of Patent: September 26, 2017Assignee: Circuit Check, Inc.Inventors: Gregory J. Michalko, Stuart K. Eickhoff, Jon A. Hample, Russell G. Carter
-
Patent number: 8847618Abstract: A circuit board tester and method that precisely aligns the probe plate and circuit board is disclosed. With a circuit board and probe plate mounting within a housing having a top and bottom, hinged together, at closure there may be slight misalignments of the two. By making one of the two plates floating, or laterally slideable with respect to each other, it is possible to make final alignment at closure. One of the two plates can be provided with a pin and the other with a pin receiving alignment block. With the lateral slideability, the pin and block can insure proper probe alignment. Additional systems for correcting misaligned pins or blocks are also disclosed.Type: GrantFiled: April 20, 2012Date of Patent: September 30, 2014Assignee: Circuit Check, Inc.Inventors: Gregory J. Michalko, Stuart K. Eickhoff, Jon A. Hample, Russell G. Carter
-
Patent number: 7852096Abstract: A circuit board tester that uses an axial translation to bring a unit under test (UUT) into physical and electric contact with a series of electrical probes. The element on the tester that comes into contact with the UUT, on the side opposite the probes, is both spring-loaded and removable. For a first configuration in which a UUT has a heat sink, an internal heat sink snaps into the top of the tester. When the UUT is tested, the heat sink on the UUT contacts the internal heat sink and depresses it slightly into the top, under the influence of a spring-loaded support. For a second configuration in which the UUT has no heat sink, a block snaps into the top of the tester, and is spring-loaded through a series of receptacles to a module that contacts the UUT during operation.Type: GrantFiled: June 22, 2004Date of Patent: December 14, 2010Assignee: Circuit CheckInventors: Stuart Eickhoff, Jon Hample
-
Patent number: 7695766Abstract: A circuit board tester that uses a dual-stage translation to bring a unit under test (UUT) into physical and electric contact first with a series of tall probes, then with a series of short probes. Initially, the UUT is mounted on a support plate, and spaced apart from both the tall and short probes. First, in order to perform a functional test on the UUT, a first vacuum stage is engaged, and atmospheric pressure translates the UUT longitudinally until contact is made with a first hard stop, defining a first position. At this first position, the UUT is in contact with a series of tall probes, and is spaced apart from a series of short probes. After a function test is performed, a second vacuum stage is engaged in addition to, and independent of, the first vacuum stage. Atmospheric pressure translates the UUT longitudinally until contact is made with a second hard stop, defining a second position.Type: GrantFiled: April 2, 2007Date of Patent: April 13, 2010Assignee: Circuit CheckInventors: Neil Adams, Stuart Eickhoff, Jon Hample
-
Patent number: 7469920Abstract: A kingpin lock including a body having a substantially frustoconical portion and a kingpin cavity having a central axis, a slide channel having a central axis and a sleeve channel having a central axis. The slide channel intersects the kingpin cavity such that its central axis is substantially offset from a radius that extends outwardly from the central axis of the kingpin cavity. The sleeve channel intersects the slide channel. A slide member is shiftable between an engaged position extending partially into the kingpin cavity and a disengaged position where the slide member does not engage the kingpin. A locking member is shiftable between an engaged position and a disengaged position such that the locking member engages an indentation in the slide member so that the slide member is secured in the engaged position and the kingpin lock is secured to the kingpin.Type: GrantFiled: May 25, 2006Date of Patent: December 30, 2008Assignee: Cargo Protectors, Inc.Inventors: Avron Rosenberg, Kirk Busse, Jon Hample
-
Publication number: 20080231299Abstract: A circuit board tester that uses a dual-stage translation to bring a unit under test (UUT) into physical and electric contact first with a series of tall probes, then with a series of short probes. Initially, the UUT is mounted on a support plate, and spaced apart from both the tall and short probes. First, in order to perform a functional test on the UUT, a first vacuum stage is engaged, and atmospheric pressure translates the UUT longitudinally until contact is made with a first hard stop, defining a first position. At this first position, the UUT is in contact with a series of tall probes, and is spaced apart from a series of short probes. After a function test is performed, a second vacuum stage is engaged in addition to, and independent of, the first vacuum stage. Atmospheric pressure translates the UUT longitudinally until contact is made with a second hard stop, defining a second position.Type: ApplicationFiled: April 2, 2007Publication date: September 25, 2008Inventors: Neil Adams, Stuart Eickhoff, Jon Hample
-
Patent number: 7200509Abstract: A circuit board tester that uses a dual-stage translation to bring a unit under test (UUT) into physical and electric contact first with a series of tall probes, then with a series of short probes. Initially, the UUT is mounted on a support plate, and spaced apart from both the tall and short probes. First, in order to perform a functional test on the UUT, a first vacuum stage is engaged, and atmospheric pressure translates the UUT longitudinally until contact is made with a first hard stop, defining a first position. At this first position, the UUT is in contact with a series of tall probes, and is spaced apart from a series of short probes. After a function test is performed, a second vacuum stage is engaged in addition to, and independent of, the first vacuum stage. Atmospheric pressure translates the UUT longitudinally until contact is made with a second hard stop, defining a second position.Type: GrantFiled: June 14, 2004Date of Patent: April 3, 2007Assignee: Circuit CheckInventors: Neil Adams, Stuart Eickhoff, Jon Hample
-
Publication number: 20060290101Abstract: A kingpin lock including a body having a substantially frustoconical portion and a kingpin cavity having a central axis, a slide channel having a central axis and a sleeve channel having a central axis. The slide channel intersects the kingpin cavity such that its central axis is substantially offset from a radius that extends outwardly from the central axis of the kingpin cavity. The sleeve channel intersects the slide channel. A slide member is shiftable between an engaged position extending partially into the kingpin cavity and a disengaged position where the slide member does not engage the kingpin. A locking member is shiftable between an engaged position and a disengaged position such that the locking member engages an indentation in the slide member so that the slide member is secured in the engaged position and the kingpin lock is secured to the kingpin.Type: ApplicationFiled: May 25, 2006Publication date: December 28, 2006Inventors: Avron Rosenberg, Kirk Busse, Jon Hample
-
Publication number: 20050270048Abstract: A circuit board tester that uses an axial translation to bring a unit under test (UUT) into physical and electric contact with a series of electrical probes. The element on the tester that comes into contact with the UUT, on the side opposite the probes, is both spring-loaded and removable. For a first configuration in which a UUT has a heat sink, an internal heat sink snaps into the top of the tester. When the UUT is tested, the heat sink on the UUT contacts the internal heat sink and depresses it slightly into the top, under the influence of a spring-loaded support. For a second configuration in which the UUT has no heat sink, a block snaps into the top of the tester, and is spring-loaded through a series of receptacles to a module that contacts the UUT during operation.Type: ApplicationFiled: June 22, 2004Publication date: December 8, 2005Applicant: Circuit CheckInventors: Stuart Eickhoff, Jon Hample
-
Publication number: 20050261854Abstract: A circuit board tester that uses a dual-stage translation to bring a unit under test (UUT) into physical and electric contact first with a series of tall probes, then with a series of short probes. Initially, the UUT is mounted on a support plate, and spaced apart from both the tall and short probes. First, in order to perform a functional test on the UUT, a first vacuum stage is engaged, and atmospheric pressure translates the UUT longitudinally until contact is made with a first hard stop, defining a first position. At this first position, the UUT is in contact with a series of tall probes, and is spaced apart from a series of short probes. After a function test is performed, a second vacuum stage is engaged in addition to, and independent of, the first vacuum stage. Atmospheric pressure translates the UUT longitudinally until contact is made with a second hard stop, defining a second position.Type: ApplicationFiled: June 14, 2004Publication date: November 24, 2005Inventors: Neil Adams, Stuart Eickhoff, Jon Hample