Abstract: An apparatus and method for performance counter verification of an electronic circuit. The apparatus and method sends a transaction to a circuit under test causing counter values to change and retrieves these counter values from the circuit under test for comparison with known or expected counter values to measure the performance of the electronic circuit under test. The apparatus and method may also generate the known or expected counter values by monitoring the transactions sent to the circuit under test. The apparatus and method may also measure elapsed time for comparison with counter values retrieved from the circuit under test. The counter values can reflect a wide variety of events, including the occurrence of certain predefined events or the amount of time that elapses between two events.