Patents by Inventor Jon David Bumgardner

Jon David Bumgardner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9291447
    Abstract: A method for manually controlling the motion of a coordinate measuring machine (CMM) is disclosed. The method may include providing at least one guide element motion tracking sensor; defining a guide element active tracking volume relative to one of the guide element tracking sensor and a portion of the CMM; placing a guide element in the active motion tracking volume; tracking the position of the guide element; and moving a measurement probe of the CMM in response to the tracked position (e.g., to follow the position changes). The method may further include detecting a tracking motion activation trigger indicator or condition, and operating the CMM to move the measurement probe portion of the CMM according to the tracking motion after the tracking motion activation trigger indicator or condition is detected and according to the condition that the guide element is located in the active tracking volume.
    Type: Grant
    Filed: July 9, 2014
    Date of Patent: March 22, 2016
    Assignee: Mitutoyo Corporation
    Inventor: Jon David Bumgardner
  • Publication number: 20160010974
    Abstract: A method for manually controlling the motion of a coordinate measuring machine (CMM) is disclosed. The method may include providing at least one guide element motion tracking sensor; defining a guide element active tracking volume relative to one of the guide element tracking sensor and a portion of the CMM; placing a guide element in the active motion tracking volume; tracking the position of the guide element; and moving a measurement probe of the CMM in response to the tracked position (e.g., to follow the position changes). The method may further include detecting a tracking motion activation trigger indicator or condition, and operating the CMM to move the measurement probe portion of the CMM according to the tracking motion after the tracking motion activation trigger indicator or condition is detected and according to the condition that the guide element is located in the active tracking volume.
    Type: Application
    Filed: July 9, 2014
    Publication date: January 14, 2016
    Inventor: Jon David Bumgardner
  • Publication number: 20150273583
    Abstract: A layer scanning inspection system is disclosed for use in conjunction with an additive workpiece fabrication system. for providing in process layer measurement of a workpiece layer during an additive workpiece fabrication process. The additive workpiece fabrication system comprises a control portion; a layer binding portion; an elevation portion comprising a Z direction motion control portion; and a fabrication scanning motion portion. The layer scanning inspection comprises: an inspection scanning motion portion configured to scan across the current workpiece layer along a scanning direction in a manner synchronized with a layer fabrication operation sequence; a non-contact sensor arrangement that is arranged on a member of the inspection scanning motion portion; and a sensor data processing portion configured to process data acquired by the non-contact sensor arrangement as the sensing region is scanned across the current workpiece layer along the scanning direction.
    Type: Application
    Filed: March 28, 2014
    Publication date: October 1, 2015
    Applicant: Mitutoyo Corporation
    Inventor: Jon David Bumgardner