Patents by Inventor Jon Kenneth Nisper

Jon Kenneth Nisper has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9767599
    Abstract: A processor-based device for displaying simulated or modeled surface appearances based on surface color and surface texture data stored in a data storage. By selecting different combinations of color and texture, different surface appearances may be modeled and displayed. Also, the device may comprise an orientation sensor. Accordingly, the device may additionally consider the orientation of the device when generating surface appearances.
    Type: Grant
    Filed: December 29, 2006
    Date of Patent: September 19, 2017
    Assignee: X-Rite Inc.
    Inventors: Francis Lamy, Jon Kenneth Nisper
  • Patent number: 8345252
    Abstract: An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions. A method of calculating xDNA, the vector sum of the observed reflectance intensity over a plurality of wavelengths and angles. Methods of using the calculated xDNA for formulating recipes for a surfaces colors.
    Type: Grant
    Filed: March 10, 2009
    Date of Patent: January 1, 2013
    Assignee: X-Rite, Inc.
    Inventors: Jon Kenneth Nisper, Thomas M. Richardson, Marc S. Ellens, Changbo Huang
  • Patent number: 8237138
    Abstract: Computer-implemented systems and methods for processing image data of a process-free plate are provided according to the present disclosure. The systems and methods may, generally, include a data acquisition step/means for receiving image data using one or more channels of a imaging system, each channel functioning to image the same target region of a process-free plate using a different wavelength of light, and a data processing step/means for filtering the image data using at least one of: (i) self-filtering, (ii) Fourier shrinkage and (iii) Wavelet shrinkage. When the image data is received using a plurality of channels, the received image data may advantageously be combined so as to optimize contrast-to-noise performance. The disclosed systems and methods may advantageously perform the operations of image de-noising, contrast enhancement, and thresholding, and may further involve compensation techniques, e.g., for minimizing distortion and blurring effects.
    Type: Grant
    Filed: April 13, 2009
    Date of Patent: August 7, 2012
    Assignee: X-Rite, Inc.
    Inventors: Jon Kenneth Nisper, Michael J. Weber, Thomas M. Richardson
  • Patent number: 7944561
    Abstract: An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.
    Type: Grant
    Filed: June 4, 2007
    Date of Patent: May 17, 2011
    Assignee: X-Rite, Inc.
    Inventors: Jon Kenneth Nisper, Patrick S. Rood, Brett Allen Pawlanta, Thomas M. Richardson, Brian Dale Teunis
  • Patent number: 7940396
    Abstract: An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.
    Type: Grant
    Filed: April 25, 2006
    Date of Patent: May 10, 2011
    Assignee: X-Rite, Inc.
    Inventors: Jon Kenneth Nisper, Patrick S. Rood, Brett Allen Pawlanta, Thomas M. Richardson, Brian Dale Teunis
  • Publication number: 20090244636
    Abstract: Computer-implemented systems and methods for processing image data of a process-free plate are provided according to the present disclosure. The systems and methods may, generally, include a data acquisition step/means for receiving image data using one or more channels of a imaging system, each channel functioning to image the same target region of a process-free plate using a different wavelength of light, and a data processing step/means for filtering the image data using at least one of: (i) self-filtering, (ii) Fourier shrinkage and (iii) Wavelet shrinkage. When the image data is received using a plurality of channels, the received image data may advantageously be combined so as to optimize contrast-to-noise performance. The disclosed systems and methods may advantageously perform the operations of image de-noising, contrast enhancement, and thresholding, and may further involve compensation techniques, e.g., for minimizing distortion and blurring effects.
    Type: Application
    Filed: April 13, 2009
    Publication date: October 1, 2009
    Applicant: X-Rite, Inc.
    Inventors: Jon Kenneth Nisper, Michael J. Weber, Thomas M. Richardson
  • Publication number: 20090213120
    Abstract: An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions. A method of calculating xDNA, the vector sum of the observed reflectance intensity over a plurality of wavelengths and angles. Methods of using the calculated xDNA for formulating recipes for a surfaces colors.
    Type: Application
    Filed: March 10, 2009
    Publication date: August 27, 2009
    Applicant: X-Rite, Inc.
    Inventors: Jon Kenneth Nisper, Thomas M. Richardson, Marc S. Ellens, Changbo Huang