Patents by Inventor Jon P. Busack

Jon P. Busack has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Badbit counter for memory testing
    Patent number: 4942576
    Abstract: Apparatus for comparing outputs of two digital devices and counting digital aberrations between them. One embodiment of this invention is the use of an XOR gate to compare the output of a DRAM under test to the output of a known good DRAM of corresponding operating characteristics, and the use of a counter to count the digital aberrations, known as badbits, between the two DRAMs.
    Type: Grant
    Filed: October 24, 1988
    Date of Patent: July 17, 1990
    Assignee: Micron Technology, Inc.
    Inventors: Jon P. Busack, Gary M. Johnson, Richard R. Clem
  • Semiconductor fuse blowing and verifying method and apparatus
    Patent number: 4937465
    Abstract: One or more selected fuses among a plurality of fuses are blown by using electronic means to discharge a capacitor and route the resulting current spike to the selected fuse. Also, a driver output current is approximated by measuring suply currents for an unloaded output and for a loaded output and comparing the two supply currents. If the driver output is connected to the active end of a fuse, the supply current demanded by the driver indicates a state of the fuse. The invention finds particular utility when used on an integrated circuit memory array with fuse activated redundancy.
    Type: Grant
    Filed: December 8, 1988
    Date of Patent: June 26, 1990
    Assignee: Micron Technology, Inc.
    Inventors: Gary M. Johnson, Jon P. Busack