Patents by Inventor Jon Welles

Jon Welles has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11585797
    Abstract: Systems and method for automatically determining offset correction values in a differential measurement system, and for correcting measurement offsets between two measurement devices in the differential measurement system. A method for determining real-time offset corrections in a gas analysis system having first and second gas analyzers includes for each of a plurality of gas concentrations within a range of gas concentrations: a) supplying the concentration of gas to the first and second gas analyzers through first and second gas flow lines, respectively; b) measuring a first gas concentration value using the first gas analyzer; and c) measuring a second gas concentration value using the second gas analyzer. The method may also include determining an offset value between each corresponding first and second gas concentration value, and determining a functional relationship between the offset values and gas concentration measurements of the first gas analyzer.
    Type: Grant
    Filed: June 18, 2020
    Date of Patent: February 21, 2023
    Assignee: Li-Cor, Inc.
    Inventors: Jon Welles, Aaron Saathoff
  • Publication number: 20200408729
    Abstract: Systems and method for automatically determining offset correction values in a differential measurement system, and for correcting measurement offsets between two measurement devices in the differential measurement system. A method for determining real-time offset corrections in a gas analysis system having first and second gas analyzers includes for each of a plurality of gas concentrations within a range of gas concentrations: a) supplying the concentration of gas to the first and second gas analyzers through first and second gas flow lines, respectively; b) measuring a first gas concentration value using the first gas analyzer; and c) measuring a second gas concentration value using the second gas analyzer. The method may also include determining an offset value between each corresponding first and second gas concentration value, and determining a functional relationship between the offset values and gas concentration measurements of the first gas analyzer.
    Type: Application
    Filed: June 18, 2020
    Publication date: December 31, 2020
    Inventors: Jon Welles, Aaron Saathoff