Patents by Inventor Jonas Hedberg

Jonas Hedberg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10809289
    Abstract: A method of determining the capacitance and loss-factor of each of a plurality of capacitive components of an electrical power device, wherein the method includes: a) obtaining for each capacitive component a respective capacitance value and loss-factor value, and b) processing the capacitance values and the loss-factor values, wherein the processing involves removing a common influence of temperature on the capacitance values from the capacitance values and removing a common influence of temperature on the loss-factor values from the loss-factor values to obtain for each capacitive component a temperature-compensated capacitance value and a temperature-compensated loss-factor value.
    Type: Grant
    Filed: February 21, 2018
    Date of Patent: October 20, 2020
    Assignee: ABB Schweiz AG
    Inventors: Nilanga Abeywickrama, Tord Bengtsson, Jonas Hedberg
  • Publication number: 20200018783
    Abstract: A method of determining the capacitance and loss-factor of each of a plurality of capacitive components of an electrical power device, wherein the method includes: a) obtaining for each capacitive component a respective capacitance value and loss-factor value, and b) processing the capacitance values and the loss-factor values, wherein the processing involves removing a common influence of temperature on the capacitance values from the capacitance values and removing a common influence of temperature on the loss-factor values from the loss-factor values to obtain for each capacitive component a temperature-compensated capacitance value and a temperature-compensated loss-factor value.
    Type: Application
    Filed: February 21, 2018
    Publication date: January 16, 2020
    Applicant: ABB Schweiz AG
    Inventors: Nilanga ABEYWICKRAMA, Tord BENGTSSON, Jonas HEDBERG
  • Patent number: 10309995
    Abstract: A method of determining phasor components of a periodic waveform, wherein the method includes: a) sampling the periodic waveform, b) determining a frequency spectrum of the sampled periodic waveform by means of a frequency transform utilizing a Gaussian window function, wherein a ratio np defined by the duration of the sampling of the periodic waveform divided by the width parameter of the Gaussian window function is at least 5, c) selecting a region of the frequency spectrum containing a frequency peak defined by a group of consecutive frequency bins each being defined by a frequency value and a magnitude value, and d) determining phasor components of the periodic waveform based on the group of consecutive frequency bins.
    Type: Grant
    Filed: October 5, 2016
    Date of Patent: June 4, 2019
    Assignee: ABB Schweiz AG
    Inventors: Nilanga Abeywickrama, Robert Saers, Tord Bengtsson, Jonas Hedberg
  • Publication number: 20180321290
    Abstract: A method of determining phasor components of a periodic waveform, wherein the method includes: a) sampling the periodic waveform, b) determining a frequency spectrum of the sampled periodic waveform by means of a frequency transform utilizing a Gaussian window function, wherein a ratio np defined by the duration of the sampling of the periodic waveform divided by the width parameter of the Gaussian window function is at least 5, c) selecting a region of the frequency spectrum containing a frequency peak defined by a group of consecutive frequency bins each being defined by a frequency value and a magnitude value, and d) determining phasor components of the periodic waveform based on the group of consecutive frequency bins.
    Type: Application
    Filed: October 5, 2016
    Publication date: November 8, 2018
    Applicant: ABB Schweiz AG
    Inventors: Nilanga Abeywickrama, Robert Saers, Tord Bengtsson, Jonas Hedberg
  • Patent number: 8508233
    Abstract: An arc detector for detecting undesired arcs. The arc detector includes: an antenna for receiving an electromagnetic signal representing an arc; and a discriminator for analyzing a signal from the antenna, the discriminator including a spectrum analyzer arranged to detect whether the signal represents a normal arc or an undesired arc. The discriminator is arranged to detect whether the signal represents a normal arc or an undesired arc by comparing signal levels at frequencies of a spectrum of the signal corresponding to at least one partial reference spectrum, and determining the arc to be a normal arc if a deviation from the reference spectrum is less than a threshold deviation. A corresponding method is also presented.
    Type: Grant
    Filed: October 21, 2010
    Date of Patent: August 13, 2013
    Assignee: ABB Research Ltd.
    Inventors: Thomas Eriksson, Stefan Halen, Jonas Hedberg
  • Publication number: 20110057662
    Abstract: An arc detector for detecting undesired arcs. The arc detector includes: an antenna for receiving an electromagnetic signal representing an arc; and a discriminator for analysing a signal from the antenna, the discriminator including a spectrum analyser arranged to detect whether the signal represents a normal arc or an undesired arc. The discriminator is arranged to detect whether the signal represents a normal arc or an undesired arc by comparing signal levels at frequencies of a spectrum of the signal corresponding to at least one partial reference spectrum, and determining the arc to be a normal arc if a deviation from the reference spectrum is less than a threshold deviation. A corresponding method is also presented.
    Type: Application
    Filed: October 21, 2010
    Publication date: March 10, 2011
    Inventors: Thomas Eriksson, Stefan Halen, Jonas Hedberg