Patents by Inventor Jonas MEIER

Jonas MEIER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • LOW-LATENCY SUBSAMPLING BANG-BANG DIGITAL PHASE-LOCKED LOOP
    Publication number: 20260163712
    Abstract: An apparatus, such as a subsampling phase locked loop (PLL), includes a digitally controlled oscillator (DCO), a digital phase detector, and a digital filter. The DCO generates a first signal having a phase based on a second signal provided to the DCO. The digital phase detector generates a third signal that represents a phase offset between a reference clock signal and the first signal. The digital filter generates the second signal by filtering out high-frequency fluctuations in the third signal.
    Type: Application
    Filed: December 5, 2024
    Publication date: June 11, 2026
    Inventors: Ulrich Moehlmann, Jonas Meier
  • METHOD OF GENERATING PARAMETERS APPLIED FOR MACHINING A WORKPIECE PERFORMED BY A MACHINE TOOL
    Publication number: 20250328123
    Abstract: A method for generating parameters applied for machining operations conducted by a machine tool.
    Type: Application
    Filed: April 8, 2025
    Publication date: October 23, 2025
    Inventors: Kurt SCHNEIDER, Jean-Philippe Besuchet, Jonas Meier, Jérémie Monnin
  • METHOD FOR CALIBRATING A DRESSING SPINDLE OF A MACHINE TOOL
    Publication number: 20250114907
    Abstract: A method for calibrating a dressing spindle of a machine tool having a main spindle arranged in a machine head and the dressing spindle arranged in the machining area, wherein a grinding tool can be mounted on the main spindle and a dressing tool can be mounted on the dressing spindle and the grinding tool and the dressing tool can be moved relatively to each other for dressing the grinding tool by the dressing tool.
    Type: Application
    Filed: July 9, 2024
    Publication date: April 10, 2025
    Inventors: Roman KRAEHENBUEHL, Stephan FLACHSBART, Jonas MEIER, Gary COOPER
  • Method for using a geometrical probe with a spindle of a machine tool, and machine tool configured to carry out such a method
    Patent number: 10768604
    Abstract: A method for using a geometrical probe (5) with a spindle (3) of a machine tool (1), wherein a probe fetch waiting state of the machine tool (1), at least one temperature parameter related to a temperature of the spindle (3) of the machine tool (1) is determined by measuring at least one temperature value for the spindle (3), and time for fetching the geometrical probe (5) is determined depending on the at least one temperature parameter.
    Type: Grant
    Filed: August 13, 2018
    Date of Patent: September 8, 2020
    Assignee: GF MACHINING SOLUTIONS AG
    Inventors: Jonas Meier, Jean-Philippe Besuchet, Kurt Schneider
  • Method For Using A Geometrical Probe With A Spindle Of A Machine Tool, And Machine Tool Configured To Carry Out Such A Method
    Publication number: 20190056711
    Abstract: A method for using a geometrical probe (5) with a spindle (3) of a machine tool (1), wherein a probe fetch waiting state of the machine tool (1), at least one temperature parameter related to a temperature of the spindle (3) of the machine tool (1) is determined by measuring at least one temperature value for the spindle (3), and time for fetching the geometrical probe (5) is determined depending on the at least one temperature parameter.
    Type: Application
    Filed: August 13, 2018
    Publication date: February 21, 2019
    Inventors: Jonas MEIER, Jean-Philippe BESUCHET, Kurt SCHNEIDER