Abstract: Various embodiments relate to a method for analyzing manufacturing process data. The method includes: receiving, by a processor, a sequence of sensor outputs from a plurality of sensors monitoring a manufacturing process; predicting, using a transformer model executed by the processor, future manufacturing process parameters based on the sensor outputs; generating one or more key influencers on a current system state based on an attention matrix of the transformer model; analyzing the predicted parameters to identify an out-of-specification parameter; and identifying one or more key contributors to the out-of-specification parameter based on the attention matrix of a transformer head associated therewith.

Abstract: An encryption method for an image, alphanumeric message, random pattern, or any other visual depiction is disclosed. Furthermore, a device for decoding the concealed message created in accordance with the aforementioned method is disclosed. The method and device rely on the limited range of light wavelengths which trigger phosphorescence in a given material. Those wavelengths can be combined with others to obscure the activating light pattern when viewed by the human eye.