Patents by Inventor Jonathan COLIN

Jonathan COLIN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measuring the curvature of a reflective surface and associated optical device
    Patent number: 11486699
    Abstract: A method for measuring the deformation of a reflective surface of an object is provided. The measuring device includes a lighting pattern containing spots of light, a camera and an image-analyzing device, the lighting pattern and the camera being arranged so that, in the measurement position, the virtual or real image of the lighting pattern is visible to the detector of the camera via the surface, the image being representative of the deformation of the lit region. The method comprises the following steps: measuring a distance between the images of two spots of light; computing the ratio between this measured distance and a reference distance; computing, from this ratio, the enlargement in a defined direction; computing the deformation of the reflective surface in the defined direction.
    Type: Grant
    Filed: May 23, 2018
    Date of Patent: November 1, 2022
    Assignee: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Alexandre Arnoult, Jonathan Colin
  • METHOD FOR MEASURING THE CURVATURE OF A REFLECTIVE SURFACE AND ASSOCIATED OPTICAL DEVICE
    Publication number: 20200158497
    Abstract: A method for measuring the deformation of a reflective surface of an object is provided. The measuring device includes a lighting pattern containing spots of light, a camera and an image-analyzing device, the lighting pattern and the camera being arranged so that, in the measurement position, the virtual or real image of the lighting pattern is visible to the detector of the camera via the surface, the image being representative of the deformation of the lit region. The method comprises the following steps: measuring a distance between the images of two spots of light; computing the ratio between this measured distance and a reference distance; computing, from this ratio, the enlargement in a defined direction; computing the deformation of the reflective surface in the defined direction.
    Type: Application
    Filed: May 23, 2018
    Publication date: May 21, 2020
    Inventors: Alexandre ARNOULT, Jonathan COLIN