Abstract: A method of performing dark correction for signals generated by an image sensor is disclosed. Dark state signals are received from an image sensor and a dark correction ratio is determined for each pixel based on the dark state signals. Operational state signals are received from the image sensor and a pseudo dark signal is determined for each pixel based on the dark correction ratio and further based on the operational state signals. A corrected signal value based on the pseudo dark signal is determined. The method is capable of compensating for dark signals from the image sensor over a course of a series of measurements notwithstanding changes in temperature and exposure time.

Abstract: A prober for measuring the light output of digital devices integrally formed on a single wafer. The prober includes a light-integrating sphere sequentially aligned with selected devices. Each time that a device is aligned with the sphere, the device aligned with the sphere is activated, so that the light output of each device is individually measured. In the disclosed embodiment, the devices are vertical cavity surface emitting lasers (VCSELs) and light emitting diodes (LEDs).

Abstract: A prober for measuring the light output of digital devices integrally formed on a single wafer. The prober includes a light-integrating sphere sequentially aligned with selected devices. Each time that a device is aligned with the sphere, the device aligned with the sphere is activated, so that the light output of each device is individually measured. In the disclosed embodiment, the devices are vertical cavity surface emitting lasers (VCSELs) and light emitting diodes (LEDs).