Patents by Inventor Jonathan David Adams

Jonathan David Adams has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device of using a scanning probe microscope
    Patent number: 11112426
    Abstract: A scanning probe microscope for high-speed imaging and/or nanomechanical mapping including a scanning probe comprising a cantilever with a tip at the distal end, and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation.
    Type: Grant
    Filed: May 11, 2016
    Date of Patent: September 7, 2021
    Assignee: ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
    Inventors: Georg Ernest Fantner, Jonathan David Adams, Adrian Pascal Nievergelt
  • Multilayer MEMS cantilevers
    Patent number: 10308500
    Abstract: The present invention relates to a cantilever or membrane comprising a body and an elongated beam attached to the body. The elongated beam includes a first layer comprising a first material, a second layer comprising a second material having an elastic modulus different to that of the first material, a third layer comprising a third material having an elastic modulus different to that of the first material, where the first layer is sandwiched between the second layer and the third layer.
    Type: Grant
    Filed: May 23, 2016
    Date of Patent: June 4, 2019
    Assignee: ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
    Inventors: Georg Ernest Fantner, Jonathan David Adams, Nahid Hosseini
  • MULTILAYER MEMS CANTILEVERS
    Publication number: 20180141801
    Abstract: The present invention relates to a cantilever or membrane comprising a body and an elongated beam attached to the body. The elongated beam includes a first layer comprising a first material, a second layer comprising a second material having an elastic modulus different to that of the first material, a third layer comprising a third material having an elastic modulus different to that of the first material, where the first layer is sandwiched between the second layer and the third layer.
    Type: Application
    Filed: May 23, 2016
    Publication date: May 24, 2018
    Inventors: Georg Ernest FANTNER, Jonathan David ADAMS, Nahid HOSSEINI
  • Method and Device of Using a Scanning Probe Microscope
    Publication number: 20180106830
    Abstract: a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation.
    Type: Application
    Filed: May 11, 2016
    Publication date: April 19, 2018
    Inventors: Georg Ernest Fantner, Jonathan David Adams, Adrian Pascal Nievergelt