Abstract: Redundantly repaired semiconductor memory and method in which the configuration data for the memory is stored in an area of the main memory array which is known to be free of bad bits, along with a signature code which serves as a pointer and verifies the validity of the configuration data. In one disclosed embodiment, the data is stored in a configuration memory which is divided into a plurality of areas of equal size and known starting addresses. The number of areas is greater than the number of permitted repairs, and the areas which do not contain defects are available for storing configuration data including device settings, repair information, and the like.

Abstract: The present invention relates to a method of a programming a select non-volatile memory cell in a plurality of serially connected non-volatile memory cells with a serially connected select transistor. Each of the non-volatile memory cells has a control gate for receiving a programming voltage and the select transistor has a select gate for receiving a select voltage. The method comprises applying the programming voltage to the control gate of the select non-volatile memory cell in a program command sequence. The magnitude of the select voltage to the select gate of the select transistor within the program command sequence is then varied. The method can be applied to non-volatile cells in a NAND or NOR architecture.