Patents by Inventor Jonathan HUNTLEY

Jonathan HUNTLEY has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for measuring distance
    Patent number: 12320639
    Abstract: An interferometry apparatus comprising: a laser source operable to emit a first light beam; a beam splitter arranged to split the first light beam into an object beam and a reference beam, the object beam passing along an object beam arm and the reference beam passing along a reference beam arm; an adaptive delay line located a distance along the reference beam arm, the adaptive delay line being configured to provide, in use, one or more length-adjusted reference beams; a beam splitter arranged to recombine the object beam from the object beam arm and the length-adjusted reference beam(s) from the reference beam arm; and a photodetector operable to detect interference between the object beam and the length-adjusted reference beam(s).
    Type: Grant
    Filed: May 13, 2021
    Date of Patent: June 3, 2025
    Assignee: LOUGHBOROUGH UNIVERSITY
    Inventors: Jonathan Huntley, Christos Pallikarakis, Pablo Ruiz
  • METHOD AND APPARATUS FOR MEASURING DISTANCE
    Publication number: 20230213326
    Abstract: An interferometry apparatus comprising: a laser source operable to emit a first light beam; a beam splitter arranged to split the first light beam into an object beam and a reference beam, the object beam passing along an object beam arm and the reference beam passing along a reference beam arm; an adaptive delay line located a distance along the reference beam arm, the adaptive delay line being configured to provide, in use, one or more length-adjusted reference beams; a beam splitter arranged to recombine the object beam from the object beam arm and the length-adjusted reference beam(s) from the reference beam arm; and a photodetector operable to detect interference between the object beam and the length-adjusted reference beam(s).
    Type: Application
    Filed: May 13, 2021
    Publication date: July 6, 2023
    Inventors: Jonathan HUNTLEY, Christos PALLIKARAKIS, Pablo RUIZ