Patents by Inventor Jonathan J. Zieman

Jonathan J. Zieman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11662283
    Abstract: A method and system for analyzing a physical characteristic of a film sample are described herein. The system may include a material holder system configured to hold the film sample. The system may include a tensile testing system configured to stretch the film sample and determine a physical characteristic of the film sample. The system may include a movable system coupled to the material holder system and configured to move the held film sample to be analyzed or tested between stations. The movable system is configured to move the held film sample in the material holder system to the tensile testing system.
    Type: Grant
    Filed: June 8, 2018
    Date of Patent: May 30, 2023
    Assignee: Dow Global Technologies LLC
    Inventors: Donald L. McCarty, II, William E. Gee, Paul OConnell, Jonathan J. Zieman, John Lund, Hitendra Singh, Scott J. Collick
  • Publication number: 20210078193
    Abstract: A method for cutting a film of material and a cutting device for cutting the film of material are described herein. The cutting device includes a film support plate, and a pressure plate configured to move relative to the film support plate to hold the film of material on the film support plate. The device further includes one or more blades, and a linear actuator configured to move the one or more blades relative to the film support plate to cut the film of material held on the film support plate.
    Type: Application
    Filed: April 30, 2018
    Publication date: March 18, 2021
    Applicant: Dow Global Technologies LLC
    Inventors: Donald L. McCarty, II, William E. Gee, Larry Dotson, Paul OConnell, Jonathan J. Zieman, John Lund
  • Publication number: 20200166443
    Abstract: A method and system for analyzing a physical characteristic of a film sample are described herein. The system may include a material holder system configured to hold the film sample. The system may include a tensile testing system configured to stretch the film sample and determine a physical characteristic of the film sample. The system may include a movable system coupled to the material holder system and configured to move the held film sample to be analyzed or tested between stations. The movable system is configured to move the held film sample in the material holder system to the tensile testing system.
    Type: Application
    Filed: June 8, 2018
    Publication date: May 28, 2020
    Applicant: Dow Global Technologies LLC
    Inventors: Donald L. McCarty, II, William E. Gee, Paul OConnell, Jonathan J. Zieman, John Lund, Hitendra Singh, Scott J. Collick
  • Publication number: 20100139374
    Abstract: The viscosity or relative viscosity of samples can be measured in parallel by dispensing or aspirating the samples at a set condition and then measuring a property of the sample such as mass dispensed or aspirated.
    Type: Application
    Filed: December 3, 2009
    Publication date: June 10, 2010
    Inventors: Daniel L. Dermody, Suraj S. Deshmukh, Matthew T. Bishop, Drew A. Davidock, J. Keith Harris, Tzu-Chi Kuo, Paul L. Morabito, Melissa A. Mushrush, Donald W. Patrick, Jonathan J. Zieman