Patents by Inventor Jonathan Jekir

Jonathan Jekir has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect detection and correction of pixel circuits for AMOLED displays
    Patent number: 10996258
    Abstract: A method of testing an array-based semiconductor device for defects during fabrication of the semiconductor device detects defects in said entities forming the semiconductor device at an intermediate stage in the fabrication of multiple types of entities forming the semiconductor device; determines whether the detected defects exceed preselected thresholds for the types of entities in which said detects are detected; if the detected defects do not exceed said preselected thresholds, continues the fabrication of the semiconductor device; and if the detected defects exceed said preselected thresholds, identifies the types of defects detected, repairs the identified defects, and continues the fabrication of the semiconductor device.
    Type: Grant
    Filed: May 30, 2014
    Date of Patent: May 4, 2021
    Assignee: Ignis Innovation Inc.
    Inventors: Gholamrezà Chaji, Jaimal Soni, Jonathan Jekir, Allyson Giannikouris
  • DEFECT DETECTION AND CORRECTION OF PIXEL CIRCUITS FOR AMOLED DISPLAYS
    Publication number: 20140329339
    Abstract: A method of testing an array-based semiconductor device for defects during fabrication of the semiconductor device detects defects in said entities forming the semiconductor device at an intermediate stage in the fabrication of multiple types of entities forming the semiconductor device; determines whether the detected defects exceed preselected thresholds for the types of entities in which said detects are detected; if the detected defects do not exceed said preselected thresholds, continues the fabrication of the semiconductor device; and if the detected defects exceed said preselected thresholds, identifies the types of defects detected, repairs the identified defects, and continues the fabrication of the semiconductor device.
    Type: Application
    Filed: May 30, 2014
    Publication date: November 6, 2014
    Applicant: Ignis Innovation Inc.
    Inventors: Gholamreza` Chaji, Jaimal Soni, Jonathan Jekir, Allyson Giannikouris