Patents by Inventor Jonathan K. Tong

Jonathan K. Tong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Nondestructive sample imaging
    Patent number: 10468230
    Abstract: A system and method for imaging a sample having a complex structure (such as an integrated circuit) implements two modes of operation utilizing a common electron beam generator that produces an electron beam within a chamber. In the first mode, the electron beam interacts directly with the sample, and backscattered electrons, secondary electrons, and backward propagating fluorescent X-rays are measured. In the second mode, the electron beam interrogates the sample via X-rays generated by the electron beam within a target that is positioned between the electron beam generator and the sample. Transmitted X-rays are measured by a detector within the vacuum chamber. The sample is placed on a movable platform to precisely position the sample with respect to the electron beam. Interferometric and/or capacitive sensors are used to measure the position of the sample and movable platform to provide high accuracy metadata for performing high resolution three-dimensional sample reconstruction.
    Type: Grant
    Filed: April 10, 2018
    Date of Patent: November 5, 2019
    Assignee: BAE Systems Information and Electronic Systems Integration Inc.
    Inventors: Eugene M. Lavely, Adam J. Marcinuk, Amrita V. Masurkar, Paul R. Moffitt, Michael S. Richman, Jonathan R. Takahashi, Jonathan K. Tong, Chris L. Willis
  • NONDESTRUCTIVE SAMPLE IMAGING
    Publication number: 20190311881
    Abstract: A system and method for imaging a sample having a complex structure (such as an integrated circuit) implements two modes of operation utilizing a common electron beam generator that produces an electron beam within a chamber. In the first mode, the electron beam interacts directly with the sample, and backscattered electrons, secondary electrons, and backward propagating fluorescent X-rays are measured. In the second mode, the electron beam interrogates the sample via X-rays generated by the electron beam within a target that is positioned between the electron beam generator and the sample. Transmitted X-rays are measured by a detector within the vacuum chamber. The sample is placed on a movable platform to precisely position the sample with respect to the electron beam. Interferometric and/or capacitive sensors are used to measure the position of the sample and movable platform to provide high accuracy metadata for performing high resolution three-dimensional sample reconstruction.
    Type: Application
    Filed: April 10, 2018
    Publication date: October 10, 2019
    Applicant: BAE Systems Information and Electronic Systems Integration Inc.
    Inventors: Eugene M. Lavely, Adam J. Marcinuk, Amrita V. Masurkar, Paul R. Moffitt, Michael S. Richman, Jonathan R. Takahashi, Jonathan K. Tong, Chris L. Willis
  • Infrared transparent visible opaque fabrics
    Patent number: 9951446
    Abstract: Infrared-transparent visible-opaque fabrics for wearable personal thermal management.
    Type: Grant
    Filed: March 16, 2017
    Date of Patent: April 24, 2018
    Assignee: Massachusetts Institute of Technology
    Inventors: Gang Chen, Jonathan K. Tong, Svetlana Boriskina, Xiaopeng Huang, James Loomis, Yanfei Xu
  • INFRARED TRANSPARENT VISIBLE OPAQUE FABRICS
    Publication number: 20180030626
    Abstract: The present invention is directed to infrared-transparent visible-opaque fabrics for wearable personal thermal management.
    Type: Application
    Filed: March 16, 2017
    Publication date: February 1, 2018
    Inventors: Gang Chen, Jonathan K. Tong, Svetlana Boriskina, Xiaopeng Huang, James Loomis, Yanfei Xu