Patents by Inventor Jonathan Leigh Dummer

Jonathan Leigh Dummer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9442155
    Abstract: A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided. In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (DUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences; a Parametric Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED; and a controller for coordinating timing of acquiring the set of measured HBLED parameters.
    Type: Grant
    Filed: November 25, 2013
    Date of Patent: September 13, 2016
    Assignee: Sof-Tek Integrators, Inc.
    Inventors: Daniel Creighton Morrow, Jonathan Leigh Dummer
  • Patent number: 9279725
    Abstract: A system and method of quantifying color and intensity of light sources including LEDs, HBLEDs (High Brightness LEDs), and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution (SPD) to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided.
    Type: Grant
    Filed: August 18, 2015
    Date of Patent: March 8, 2016
    Assignee: Sof-Tek Integrators, Inc.
    Inventors: Daniel Creighton Morrow, Jonathan Leigh Dummer
  • Publication number: 20150355028
    Abstract: A system and method of quantifying color and intensity of light sources including LEDs, HBLEDs (High Brightness LEDs), and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution (SPD) to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided.
    Type: Application
    Filed: August 18, 2015
    Publication date: December 10, 2015
    Inventors: Daniel Creighton MORROW, Jonathan Leigh DUMMER
  • Patent number: 9128144
    Abstract: A system and method of quantifying color and intensity of light sources including LEDs, HBLEDs (High Brightness LEDs), and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution (SPD) to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided.
    Type: Grant
    Filed: August 8, 2011
    Date of Patent: September 8, 2015
    Assignee: Sof-Tek Integrators, Inc.
    Inventors: Daniel Creighton Morrow, Jonathan Leigh Dummer
  • Publication number: 20140088910
    Abstract: A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided. In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (DUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences; a Parametric Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED; and a controller for coordinating timing of acquiring the set of measured HBLED parameters.
    Type: Application
    Filed: November 25, 2013
    Publication date: March 27, 2014
    Applicant: Sof-Tek Integrators, Inc. dba Op-Test
    Inventors: Daniel Creighton Morrow, Jonathan Leigh Dummer
  • Patent number: 8593148
    Abstract: A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided.
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: November 26, 2013
    Assignee: Sof-Tek Integrators, Inc.
    Inventors: Daniel Creighton Morrow, Jonathan Leigh Dummer
  • Publication number: 20120038363
    Abstract: A system and method of quantifying color and intensity of light sources including LEDs, HBLEDs (High Brightness LEDs), and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution (SPD) to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided.
    Type: Application
    Filed: August 8, 2011
    Publication date: February 16, 2012
    Applicant: Sof-Tek Integrators, Inc. dba Op-Test
    Inventors: Daniel Creighton Morrow, Jonathan Leigh Dummer
  • Publication number: 20110025337
    Abstract: A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided. In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (DUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences; a Parametric Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED; and a controller for coordinating timing of acquiring the set of measured HBLED parameters.
    Type: Application
    Filed: July 29, 2010
    Publication date: February 3, 2011
    Inventors: Daniel Creighton Morrow, Jonathan Leigh Dummer